Dangerous Bonds Individual of Hydrogenated Amorphous Silicon and Defect Absorption Spectra

IF 1 Q3 PHYSICS, MULTIDISCIPLINARY East European Journal of Physics Pub Date : 2023-12-02 DOI:10.26565/2312-4334-2023-4-30
Rustamjon G. Ikramov, K. Muminov, M. Nuritdinova, Bobur Q. Sutonov, Oybek T. Kholmirzayev, A’zamxo’ja A. Mamakhanov
{"title":"Dangerous Bonds Individual of Hydrogenated Amorphous Silicon and Defect Absorption Spectra","authors":"Rustamjon G. Ikramov, K. Muminov, M. Nuritdinova, Bobur Q. Sutonov, Oybek T. Kholmirzayev, A’zamxo’ja A. Mamakhanov","doi":"10.26565/2312-4334-2023-4-30","DOIUrl":null,"url":null,"abstract":"In this work, defect absorption spectra for defects characteristic of hydrogenated amorphous silicon are theoretically studied. It is shown that in order to determine defect absorption spectra using the Kubo-Greenwood formula, the indefinite integral in this formula must be written in a certain form. It was discovered that electronic transitions involving defect states are divided into two parts depending on the energy of absorbed photons. The values of the partial defect absorption spectrum at low energies of absorbed photons have almost no effect on the overall defect absorption spectrum. It has been established that the main role in determining the defect absorption spectrum is played by partial spectra determined by optical transitions of electrons between allowed bands and defects. It is shown that with a power-law distribution of the density of electronic states in allowed bands, the spectra of optical transitions between them and defects do not depend on the value of this power.","PeriodicalId":42569,"journal":{"name":"East European Journal of Physics","volume":null,"pages":null},"PeriodicalIF":1.0000,"publicationDate":"2023-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"East European Journal of Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.26565/2312-4334-2023-4-30","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

In this work, defect absorption spectra for defects characteristic of hydrogenated amorphous silicon are theoretically studied. It is shown that in order to determine defect absorption spectra using the Kubo-Greenwood formula, the indefinite integral in this formula must be written in a certain form. It was discovered that electronic transitions involving defect states are divided into two parts depending on the energy of absorbed photons. The values of the partial defect absorption spectrum at low energies of absorbed photons have almost no effect on the overall defect absorption spectrum. It has been established that the main role in determining the defect absorption spectrum is played by partial spectra determined by optical transitions of electrons between allowed bands and defects. It is shown that with a power-law distribution of the density of electronic states in allowed bands, the spectra of optical transitions between them and defects do not depend on the value of this power.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
氢化无定形硅的危险键个体和缺陷吸收光谱
这项工作从理论上研究了氢化非晶硅特征缺陷的缺陷吸收光谱。研究表明,要使用 Kubo-Greenwood 公式确定缺陷吸收光谱,必须以一定的形式写出该公式中的不定积分。研究发现,涉及缺陷态的电子跃迁根据吸收光子的能量分为两部分。在吸收光子的低能量下,部分缺陷吸收光谱的值对整个缺陷吸收光谱几乎没有影响。已经证实,决定缺陷吸收光谱的主要作用是由电子在允许带和缺陷之间的光学跃迁所决定的部分光谱。研究表明,在允许带电子态密度呈幂律分布的情况下,允许带和缺陷之间的光学跃迁光谱与幂律值无关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
East European Journal of Physics
East European Journal of Physics PHYSICS, MULTIDISCIPLINARY-
CiteScore
1.10
自引率
25.00%
发文量
58
审稿时长
8 weeks
期刊最新文献
Non-Relativistic Calculation of Excited-State Ionization Potentials for Li-Like Ions Using Weakest Bound Electron Potential Model Theory The Mechanism of the Formation of Binary Compounds Between Zn and S Impurity Atoms in Si Crystal Lattice Surface Electromagnetic TE-Waves Total Internal Reflection Instability of Ion Cyclotron Waves (ICWS) at the Expense of Lower Hybrid Drift Waves (LHDWS) Turbulence Energy Influence of silicon characteristics on the parameters of manufactured photonics cells
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1