Applied Cavity Perturbation Used for Frequency Identification of Channel Ports in Manifold-Coupled Multiplexers

IF 0.9 4区 工程技术 Q4 COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS International Journal of RF and Microwave Computer-Aided Engineering Pub Date : 2023-11-28 DOI:10.1155/2023/8302207
S. R. Mirnaziry, A. Kheirdoost, M. Haghparast, A. Ahmadi
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Abstract

We investigate a practical technique for deembedding the channel filter S-parameters of manifold-coupled multiplexers (MUXs), without detaching filters from the manifold. The method is applicable for MUXs with an arbitrary number of channels and can be used for the device regardless of its bandwidth, guard band, or loss of filters. We reconfigure the N-port MUX to two simpler networks cascaded to each other. We assume that the manifold response is unknown and use the idea of applied perturbation on the channel filter, and then by comparing the response of the overall cascaded network, before and after the perturbation, we approximate the channel port response. The technique is useful in fast detecting the unexpectedly detuned channels or likely faults in the device without unnecessary plugging/unplugging; it is also useful in roughly tuning of the channel filers at the early stage of MUX tuning. The technique can be easily traced by the telecommunication community.
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应用空腔扰动识别歧管耦合多路复用器中的通道端口频率
我们研究了一种实用技术,可在不将滤波器从多路复用器(MUX)上分离的情况下,对多路耦合多路复用器(MUX)的通道滤波器 S 参数进行脱嵌。该方法适用于具有任意通道数的多路复用器,并且无论其带宽、保护带或滤波器损耗如何,均可用于该设备。我们将 N 端口 MUX 重新配置为两个相互级联的简单网络。我们假定流形响应是未知的,并利用对信道滤波器施加扰动的想法,然后通过比较整个级联网络在扰动前后的响应,近似得出信道端口的响应。该技术有助于快速检测意外失谐的通道或器件中可能存在的故障,而无需进行不必要的插拔;它还有助于在 MUX 调整的早期阶段对通道滤波器进行粗略调整。电信界可以很容易地跟踪这项技术。
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来源期刊
CiteScore
4.00
自引率
23.50%
发文量
489
审稿时长
3 months
期刊介绍: International Journal of RF and Microwave Computer-Aided Engineering provides a common forum for the dissemination of research and development results in the areas of computer-aided design and engineering of RF, microwave, and millimeter-wave components, circuits, subsystems, and antennas. The journal is intended to be a single source of valuable information for all engineers and technicians, RF/microwave/mm-wave CAD tool vendors, researchers in industry, government and academia, professors and students, and systems engineers involved in RF/microwave/mm-wave technology. Multidisciplinary in scope, the journal publishes peer-reviewed articles and short papers on topics that include, but are not limited to. . . -Computer-Aided Modeling -Computer-Aided Analysis -Computer-Aided Optimization -Software and Manufacturing Techniques -Computer-Aided Measurements -Measurements Interfaced with CAD Systems In addition, the scope of the journal includes features such as software reviews, RF/microwave/mm-wave CAD related news, including brief reviews of CAD papers published elsewhere and a "Letters to the Editor" section.
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