Designing a Compact High-precision Positioner with Large Stroke Capability for Nanoindentation Devices

IgMin Research Pub Date : 2023-11-22 DOI:10.61927/igmin118
Mohammad Tarek
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Abstract

A new design of a fine positioner or high precision driven unit with a large positioning range is proposed for a custom-made in-situ indenter device equipped inside an SEM chamber. The design configuration of the proposed system is size-effective for the confined working area of the SEM chamber. The indentation depths can be precisely varied by controlling the fine positioner driven by a piezoelectric actuator. The main goal is to achieve very deep penetrations toward the bottom layers of tall or large-size scale specimens by single indentation, without the need for sequential indentations. Thus, the proposed design can eliminate the need for sequential adjustments of the specimen position with respect to the indenter tip as currently being practiced by the researchers. The specimen position adjustment after each indentation heavily depends on the coarse positioner and its accuracy level in a sub-millimeter regime which could result in position errors and unwanted lateral forces in the nanoindentation process. Therefore, the sequential indentations technique could lead to considerable variations in the outcomes of nanoindentation tests done on similar specimens. The proposed design will be realized to deploy in the Continuous Stiffness Measurement (CSM) techniques generally used to evaluate elastic properties as a function of continuous penetration depth with high-frequency loading and unloading cycles.
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为纳米压痕设备设计具有大行程能力的紧凑型高精度定位器
针对配备在扫描电镜室内的定制原位压头装置,提出了一种具有大定位范围的精细定位器或高精度驱动装置的新设计。针对扫描电镜室狭小的工作区域,拟议系统的设计配置具有尺寸效益。通过控制由压电致动器驱动的精细定位器,可以精确地改变压痕深度。其主要目标是通过单次压入实现对高大尺寸试样底层的深度穿透,而无需连续压入。因此,拟议的设计无需像目前研究人员所做的那样,依次调整试样相对于压头尖端的位置。每次压痕后的试样位置调整在很大程度上取决于粗定位器及其亚毫米级的精度水平,这可能导致纳米压痕过程中的位置误差和不必要的横向力。因此,顺序压痕技术可能会导致在类似试样上进行的纳米压痕测试结果出现相当大的差异。拟议的设计将用于连续刚度测量(CSM)技术,该技术通常用于评估弹性特性,作为高频加载和卸载循环的连续穿透深度的函数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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