AI safety of film capacitors

IF 3.8 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IET Nanodielectrics Pub Date : 2023-11-16 DOI:10.1049/nde2.12071
Yong-Xin Zhang, Fang-Yi Chen, Di-Fan Liu, Jian-Xiao Wang, Qi-Kun Feng, Hai-Yang Jiang, Xin-Jie Wang, Hong-Bo Zhao, Shao-Long Zhong, Faisal Mehmood Shah, Zhi-Min Dang
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Abstract

With a large number of film capacitors being deployed in critical locations in electrical and electronic systems, artificial intelligence (AI) technology is also expected to address the problems encountered in this process. According to our findings, AI applications can cover the entire lifecycle of film capacitors. However, the AI safety hazards in these applications have not received the attention they deserve. To meet this, the authors argue, with specific examples, risks that flawed, erratic, and unethical AI can introduce in the design, operation, and evaluation of film capacitors. Human-AI common impact and more multi-dimensional evaluation for AI are proposed to better cope with unknown, ambiguity, and known risks brought from AI in film capacitors now and in the future.

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薄膜电容器的 AI 安全性
随着大量薄膜电容器被部署在电气和电子系统的关键位置,人工智能(AI)技术也有望解决这一过程中遇到的问题。根据我们的研究结果,人工智能应用可覆盖薄膜电容器的整个生命周期。然而,这些应用中的人工智能安全隐患并未得到应有的重视。为此,作者通过具体实例论证了有缺陷、不稳定和不道德的人工智能在薄膜电容器的设计、运行和评估中可能带来的风险。作者提出了人类与人工智能的共同影响以及对人工智能进行更多维度评估的建议,以更好地应对人工智能在薄膜电容器中带来的未知、模糊和已知风险。
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来源期刊
IET Nanodielectrics
IET Nanodielectrics Materials Science-Materials Chemistry
CiteScore
5.60
自引率
3.70%
发文量
7
审稿时长
21 weeks
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