V. Moock, Darien E. Arce Chávez, Crescencio García-Segundo, L. Ruiz-Huerta
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引用次数: 0
Abstract
BACKGROUND: The environmental impact on industrial X-ray tomography systems has gained its attention in terms of image precision and metrology over recent years, yet is still complex due to the variety of applications. OBJECTIVE: The current study explores the photothermal repercussions of the overall radiation exposure time. It shows the emerging dimensional uncertainty when measuring a stainless steel sphere by means of circular tomography scans. METHODS: The authors develop a novel frame difference method for X-ray radiographies to evaluate the spatial changes induced in the projected absorption maps on the X-ray panel. The object of interest has a simple geometry for the purpose of proof of concept. The dominant source of the observed radial uncertainty is the photothermal effect due to high-energy X-ray scattering at the metal workpiece. Thermal variations are monitored by an infrared camera within the industrial tomography system, which confines that heat in the industrial grade X-ray system. RESULTS: The authors demonstrate that dense industrial computed tomography programs with major X-ray power notably affect the uncertainty of digital dimensional measurements. The registered temperature variations are consistent with dimensional changes in radiographies and hence form a source of error that might result in visible artifacts within the 3D image reconstruction. CONCLUSIONS: This contribution is of fundamental value to reach the balance between the number of projections and radial uncertainty tolerance when performing analysis with X-ray dimensional exploration in precision measurements with industrial tomography.
背景:近年来,工业 X 射线层析成像系统对环境的影响在图像精度和计量方面越来越受到关注,但由于应用的多样性,这种影响仍然很复杂。目的:本研究探讨了整体辐射照射时间的光热影响。它显示了通过圆形断层扫描测量不锈钢球时出现的尺寸不确定性。方法:作者为 X 射线放射成像开发了一种新颖的帧差法,用于评估 X 射线面板上的投射吸收图引起的空间变化。为了验证概念,研究对象的几何形状非常简单。观察到的径向不确定性的主要来源是金属工件上高能 X 射线散射引起的光热效应。热变化由工业层析成像系统中的红外摄像机监测,红外摄像机将热量限制在工业级 X 射线系统中。结果:作者证明,具有强大 X 射线能量的密集型工业计算机断层扫描程序会明显影响数字尺寸测量的不确定性。记录的温度变化与射线照片中的尺寸变化一致,因此形成了一个误差源,可能导致三维图像重建中出现可见的伪影。结论:在使用工业断层扫描技术进行精密测量时,利用 X 射线尺寸探测进行分析时,要在投影次数和径向不确定性容差之间取得平衡,本研究成果具有重要价值。
期刊介绍:
Research areas within the scope of the journal include:
Interaction of x-rays with matter: x-ray phenomena, biological effects of radiation, radiation safety and optical constants
X-ray sources: x-rays from synchrotrons, x-ray lasers, plasmas, and other sources, conventional or unconventional
Optical elements: grazing incidence optics, multilayer mirrors, zone plates, gratings, other diffraction optics
Optical instruments: interferometers, spectrometers, microscopes, telescopes, microprobes