{"title":"Imaging of conducting materials via the Kernel Method","authors":"A. Tamburrino, Vincenzo Mottola","doi":"10.3233/jae-230167","DOIUrl":null,"url":null,"abstract":"In this work, we present a new non-iterative imaging method for Electrical Resistance Tomography (ERT). The problem in ERT is retrieving the spatial behaviour of the electrical conductivity by means of boundary measurements in steady-state conditions. Specifically, the interest is focused on the inverse obstacle problem, that consists in reconstructing the shape, position and dimension of one or more anomalies embedded in a known background. The proposed method, called Kernel Method, is based on the idea that if there exists a current density Jn that applied at the boundary ∂𝛺 of the domain under investigation 𝛺 produces the same scalar potential (on ∂𝛺), with and without anomalies, then the power density corresponding to Jn, evaluated on a configuration without anomalies, is vanishing in the region occupied by the latter. The proposed method has a very low computational cost. Indeed, the evaluation of the desired current density Jn on ∂𝛺 requires a negligible computational effort, and the reconstructions require only one forward problem.","PeriodicalId":50340,"journal":{"name":"International Journal of Applied Electromagnetics and Mechanics","volume":null,"pages":null},"PeriodicalIF":1.1000,"publicationDate":"2024-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Applied Electromagnetics and Mechanics","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.3233/jae-230167","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this work, we present a new non-iterative imaging method for Electrical Resistance Tomography (ERT). The problem in ERT is retrieving the spatial behaviour of the electrical conductivity by means of boundary measurements in steady-state conditions. Specifically, the interest is focused on the inverse obstacle problem, that consists in reconstructing the shape, position and dimension of one or more anomalies embedded in a known background. The proposed method, called Kernel Method, is based on the idea that if there exists a current density Jn that applied at the boundary ∂𝛺 of the domain under investigation 𝛺 produces the same scalar potential (on ∂𝛺), with and without anomalies, then the power density corresponding to Jn, evaluated on a configuration without anomalies, is vanishing in the region occupied by the latter. The proposed method has a very low computational cost. Indeed, the evaluation of the desired current density Jn on ∂𝛺 requires a negligible computational effort, and the reconstructions require only one forward problem.
期刊介绍:
The aim of the International Journal of Applied Electromagnetics and Mechanics is to contribute to intersciences coupling applied electromagnetics, mechanics and materials. The journal also intends to stimulate the further development of current technology in industry. The main subjects covered by the journal are:
Physics and mechanics of electromagnetic materials and devices
Computational electromagnetics in materials and devices
Applications of electromagnetic fields and materials
The three interrelated key subjects – electromagnetics, mechanics and materials - include the following aspects: electromagnetic NDE, electromagnetic machines and devices, electromagnetic materials and structures, electromagnetic fluids, magnetoelastic effects and magnetosolid mechanics, magnetic levitations, electromagnetic propulsion, bioelectromagnetics, and inverse problems in electromagnetics.
The editorial policy is to combine information and experience from both the latest high technology fields and as well as the well-established technologies within applied electromagnetics.