Testing Phase 2 of a Targeted Boredom Intervention Training Program and its Impact on Boredom Misbeliefs

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-01-27 DOI:10.1177/08295735241227514
Virginia M. C. Tze, Vanessa L. Rilkoff, Lia M. Daniels, Patti C. Parker
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Abstract

Boredom is a commonly experienced emotion that is detrimental to student performance. This study piloted Phase 2 of the Boredom Intervention Training (BIT) program which used cognitive restructuring to alter students’ boredom misbeliefs. The sample consisted of 149 students from a midwestern Canadian University. We identified participants’ boredom misbeliefs at baseline and employed McNemar tests to determine if students reported fewer boredom misbeliefs after viewing a psychoeducational training video. Our results revealed students reported fewer boredom misbeliefs post-video compared to pre-video (all p’s < .025). Implications of Phase 2 of the BIT program for university students are discussed.
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测试有针对性的无聊干预培训计划第二阶段及其对无聊误解的影响
厌学是一种常见的情绪,对学生的学习成绩不利。本研究试行了无聊干预训练(BIT)项目的第二阶段,通过认知重组来改变学生的无聊误解。样本包括来自加拿大中西部一所大学的 149 名学生。我们确定了参与者在基线时的无聊误解,并采用麦克尼玛测试来确定学生在观看心理教育培训视频后是否减少了无聊误解。我们的结果显示,与观看视频前相比,观看视频后学生报告的无聊误解更少(所有 P 均小于 0.025)。本文讨论了 BIT 计划第二阶段对大学生的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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