Axel Jantsch, Swaroop Ghosh, Umit Ogras, Pascal Meinerzhagen
{"title":"ISLPED 2023: International Symposium on Low-Power Electronics and Design","authors":"Axel Jantsch, Swaroop Ghosh, Umit Ogras, Pascal Meinerzhagen","doi":"10.1109/mdat.2023.3324518","DOIUrl":null,"url":null,"abstract":"The ISLPED 2023 conference was held as a presence-only event from 6 to 8 August 2023, at the premises of the Technische Universität TU Wien near the center of Vienna, Austria. It was the first presence-only meeting after the disruption due to the COVID-19 pandemic, which was very much enjoyed by all delegates. 35 full papers and 18 posters were presented in two parallel sessions. Also, two keynote presentations, one special session, and one panel were organized. In addition, a design contest with seven participants was conducted. Again, artificial neural network-based machine-learning topics have been prominently represented in both the technical and special sessions.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"296 2 1","pages":""},"PeriodicalIF":1.9000,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/mdat.2023.3324518","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
The ISLPED 2023 conference was held as a presence-only event from 6 to 8 August 2023, at the premises of the Technische Universität TU Wien near the center of Vienna, Austria. It was the first presence-only meeting after the disruption due to the COVID-19 pandemic, which was very much enjoyed by all delegates. 35 full papers and 18 posters were presented in two parallel sessions. Also, two keynote presentations, one special session, and one panel were organized. In addition, a design contest with seven participants was conducted. Again, artificial neural network-based machine-learning topics have been prominently represented in both the technical and special sessions.
期刊介绍：
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
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