{"title":"The 28th IEEE European Test Symposium","authors":"Naghmeh Karimi","doi":"10.1109/mdat.2023.3292800","DOIUrl":null,"url":null,"abstract":"The 28th IEEE European Test Symposium (ETS) was held in Venice, Italy, 22–26 May 2023, in a hybrid format. This was the second hybrid venue for ETS since the COVID-19 pandemic. ETS is Europe’s premier forum in the area of electronic-based circuits and system testing, reliability, security, and validation. ETS’23 was arranged in five days and the program consisted of keynotes, scientific paper presentations, panels, workshops, highlights/demos from the industry, a PhD forum, and a McCluskey contest. It also included the Test Spring School (TSS). A total of 238 attendees (including both in-person and virtual) registered for the conference from 36 countries among which 102 were from industry and 135 were affiliated with academia (including 53 students).","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"5 1","pages":""},"PeriodicalIF":1.9000,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/mdat.2023.3292800","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
The 28th IEEE European Test Symposium (ETS) was held in Venice, Italy, 22–26 May 2023, in a hybrid format. This was the second hybrid venue for ETS since the COVID-19 pandemic. ETS is Europe’s premier forum in the area of electronic-based circuits and system testing, reliability, security, and validation. ETS’23 was arranged in five days and the program consisted of keynotes, scientific paper presentations, panels, workshops, highlights/demos from the industry, a PhD forum, and a McCluskey contest. It also included the Test Spring School (TSS). A total of 238 attendees (including both in-person and virtual) registered for the conference from 36 countries among which 102 were from industry and 135 were affiliated with academia (including 53 students).
期刊介绍：
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
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