{"title":"Losing My Memory","authors":"Scott Davidson","doi":"10.1109/mdat.2023.3312570","DOIUrl":null,"url":null,"abstract":"I was happy to see the article on estimating memory usage by Yoon et al. in this issue of <italic xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\">IEEE Design&Test</i>\n. I have not seen much work on this subject lately. I have heard those who do software for embedded systems rightly express pride in how efficiently they write code but judging from the memory usage data on programs I run on my laptop, many modern software developers are allergic to the system call that frees up memory. I check this because my somewhat antiquated computer (eight years old) runs slowly. But what should I expect? It has only 6 GB of memory.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"223 1","pages":""},"PeriodicalIF":1.9000,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/mdat.2023.3312570","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
I was happy to see the article on estimating memory usage by Yoon et al. in this issue of IEEE Design&Test
. I have not seen much work on this subject lately. I have heard those who do software for embedded systems rightly express pride in how efficiently they write code but judging from the memory usage data on programs I run on my laptop, many modern software developers are allergic to the system call that frees up memory. I check this because my somewhat antiquated computer (eight years old) runs slowly. But what should I expect? It has only 6 GB of memory.
期刊介绍：
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
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