Absolute calibration of the ratio of Xe/O two-photon absorption cross-sections for O-TALIF applications

Zhan Shu, N. Popov, S. Starikovskaia
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Abstract

The paper presents a calibration of the ratio of two-photon absorption cross sections, $\sigma^{(2)}_{Xe}/ \sigma^{(2)}_O$, necessary for the absolute O-atom density measurements by two-photon absorption laser-induced fluorescence (TALIF) technique. To calibrate the ratio of the cross-sections, a special discharge with 100\% dissociation of molecular oxygen, and so with a known “reference” density of O-atom [O]$_{ref}$=2$\cdot$[O$_2$] was suggested. This is a nanosecond capillary discharge in N$_2$: O$_2$ mixtures with a few percent of oxygen at a reduced electric field of a few hundred of Td and specific deposited energy of about 1 eV/molecule. Voltage at the electrodes, electrical current in the plasma, longitudinal electric field and energy delivered to the gas were measured with 0.2~ns synchronisation. Additionally, radial distribution of emission of excited nitrogen molecules and gas temperature in the discharge and afterglow were obtained experimentally. Detailed 1D kinetic modeling was suggested to confirm complete O$_2$ dissociation and to analyse the main reactions. By comparing the data measured by TALIF technique with the ``reference'' density of oxygen atoms [O]$_{ref}$, the ratio of the two-photon absorption cross-sections $\sigma^{(2)}_{Xe}/ \sigma^{(2)}_O$ was determined.
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用于 O-TALIF 的 Xe/O 双光子吸收截面比的绝对校准
本文介绍了双光子吸收截面比($\sigma^{(2)}_{Xe}/ \sigma^{(2)}_O$)的校准方法,这是利用双光子吸收激光诱导荧光(TALIF)技术测量O原子绝对密度所必需的。为了校准横截面的比值,建议使用分子氧解离率为 100% 的特殊放电,从而获得已知的 O 原子 "参考 "密度 [O]$_{ref}$=2$\cdot$[O$_2$]。这是 N$_2$ 中的纳秒毛细管放电:O$_2$ 混合物中的纳秒级毛细管放电,在几百 Td 的减弱电场和约 1 eV/分子的比沉积能量下,氧气的含量为百分之几。电极上的电压、等离子体中的电流、纵向电场和输送到气体中的能量都是在 0.2~ns 的同步条件下测量的。此外,还通过实验获得了受激氮分子发射的径向分布以及放电和余辉中的气体温度。建议进行详细的一维动力学建模,以确认 O$_2$ 的完全解离并分析主要反应。通过将 TALIF 技术测得的数据与氧原子的 "参考 "密度 [O]$_{ref}$ 进行比较,确定了双光子吸收截面的比率 $\sigma^{(2)}_{Xe}/ \sigma^{(2)}_O$。
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