Guiomar Riu-Perdrix, Andrea Valencia-Cadena, Luis Llanes, J. Roa
{"title":"Cemented Carbide End-Mill Edge Preparation Using Dry-Electropolishing","authors":"Guiomar Riu-Perdrix, Andrea Valencia-Cadena, Luis Llanes, J. Roa","doi":"10.3390/jmmp8010028","DOIUrl":null,"url":null,"abstract":"Precision edge preparation techniques for cemented carbides enable optimization of the geometry of tools’ cutting edges. These techniques are frequently used in high-stress environments, resulting in substantial improvements in tools’ cutting performance. This investigation examined the impact and evolution of cutting edge parameters and resulting surface finishes as a function of dry-electropolishing time on an end-mill. Findings demonstrate enlargement of the cutting edge radius, a decrease in surface roughness, and the mitigation of defects induced during previous manufacturing stages (i.e., smashed ceramic particles, burrs, chipping, etc.). Additionally, a direct correlation between dry-electropolishing time and primary cutting edges’ micro-geometry parameters has been established.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"10 9","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/jmmp8010028","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Precision edge preparation techniques for cemented carbides enable optimization of the geometry of tools’ cutting edges. These techniques are frequently used in high-stress environments, resulting in substantial improvements in tools’ cutting performance. This investigation examined the impact and evolution of cutting edge parameters and resulting surface finishes as a function of dry-electropolishing time on an end-mill. Findings demonstrate enlargement of the cutting edge radius, a decrease in surface roughness, and the mitigation of defects induced during previous manufacturing stages (i.e., smashed ceramic particles, burrs, chipping, etc.). Additionally, a direct correlation between dry-electropolishing time and primary cutting edges’ micro-geometry parameters has been established.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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