{"title":"Recap of the 42nd Edition of the International Conference on Computer- Aided Design (ICCAD 2023)","authors":"Evangeline Young","doi":"10.1109/mdat.2024.3351568","DOIUrl":null,"url":null,"abstract":"This Year Marks our return to a fully in-person International Conference on Computer-Aided Design (ICCAD) after the COVID-19 pandemic. We are thrilled to resume an event with personal interactions and extensive networking while retaining some good practices adopted during the pandemic of having a virtual platform where participants and authors can connect remotely.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2024-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/mdat.2024.3351568","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
This Year Marks our return to a fully in-person International Conference on Computer-Aided Design (ICCAD) after the COVID-19 pandemic. We are thrilled to resume an event with personal interactions and extensive networking while retaining some good practices adopted during the pandemic of having a virtual platform where participants and authors can connect remotely.
期刊介绍：
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
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