{"title":"Suitability and Applications of Total-Reflection X-Ray Fluorescence Spectrometry for Analytical Characterization of Nuclear Materials.","authors":"Kaushik Sanyal, Sangita Dhara","doi":"10.1080/10408347.2024.2316234","DOIUrl":null,"url":null,"abstract":"<p><p>The suitability and applications of Total reflection X-ray Fluorescence (TXRF) for characterization of nuclear materials are numerous. TXRF has been successfully applied for trace, minor and major determinations of constituents in nuclear materials such as fuel, clad, control rod, coolant, etc. The two major advantages of TXRF i.e. requirement of very small sample for analysis and non-requirement of matrix matched standards, make this technique further more attractive and suitable for nuclear industry. The applications of TXRF for trace analysis in nuclear materials such as fuel, clad, coolant and control rods are described in detail along with its applications for determination of major and speciation studies in TXRF mode.</p>","PeriodicalId":10744,"journal":{"name":"Critical reviews in analytical chemistry","volume":" ","pages":"1-16"},"PeriodicalIF":4.2000,"publicationDate":"2024-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Critical reviews in analytical chemistry","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1080/10408347.2024.2316234","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, ANALYTICAL","Score":null,"Total":0}
引用次数: 0
Abstract
The suitability and applications of Total reflection X-ray Fluorescence (TXRF) for characterization of nuclear materials are numerous. TXRF has been successfully applied for trace, minor and major determinations of constituents in nuclear materials such as fuel, clad, control rod, coolant, etc. The two major advantages of TXRF i.e. requirement of very small sample for analysis and non-requirement of matrix matched standards, make this technique further more attractive and suitable for nuclear industry. The applications of TXRF for trace analysis in nuclear materials such as fuel, clad, coolant and control rods are described in detail along with its applications for determination of major and speciation studies in TXRF mode.
全反射 X 射线荧光（TXRF）在核材料表征方面的适用性和应用非常广泛。全反射 X 射线荧光已成功应用于燃料、包壳、控制棒、冷却剂等核材料中成分的痕量、次要和主要测定。TXRF 的两大优势，即只需极少量的样品进行分析和无需基质匹配标准，使这项技术更加具有吸引力，也更加适合核工业。本文详细介绍了 TXRF 在核材料（如燃料、包壳、冷却剂和控制棒）痕量分析中的应用，以及 TXRF 模式在主要成分测定和物种研究中的应用。
期刊介绍：
Critical Reviews in Analytical Chemistry continues to be a dependable resource for both the expert and the student by providing in-depth, scholarly, insightful reviews of important topics within the discipline of analytical chemistry and related measurement sciences. The journal exclusively publishes review articles that illuminate the underlying science, that evaluate the field''s status by putting recent developments into proper perspective and context, and that speculate on possible future developments. A limited number of articles are of a "tutorial" format written by experts for scientists seeking introduction or clarification in a new area.
This journal serves as a forum for linking various underlying components in broad and interdisciplinary means, while maintaining balance between applied and fundamental research. Topics we are interested in receiving reviews on are the following:
· chemical analysis;
· instrumentation;
· chemometrics;
· analytical biochemistry;
· medicinal analysis;
· forensics;
· environmental sciences;
· applied physics;
· and material science.
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