X-ray diffraction under grazing incidence conditions

IF 50.1 Q1 MULTIDISCIPLINARY SCIENCES Nature reviews. Methods primers Pub Date : 2024-02-29 DOI:10.1038/s43586-024-00293-8
Oliver Werzer, Stefan Kowarik, Fabian Gasser, Zhang Jiang, Joseph Strzalka, Christopher Nicklin, Roland Resel
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Abstract

Material properties frequently relate to structures at or near surfaces, particularly in thin films. As a result, it is essential to understand these structures at the molecular and atomistic levels. The most accurate and widely used techniques for characterizing crystallographic order are based on X-ray diffraction. When dealing with thin films or interfaces, standard approaches, such as single crystal or powder diffraction, are not suitable. However, X-ray diffraction under grazing incidence conditions can provide the required information. In this Primer, grazing incidence X-ray diffraction (GIXD) is comprehensively introduced, starting from basic considerations on X-ray diffraction at crystals with reduced dimensionality and the optical properties of X-rays, followed by a more in-depth description of an experimental performance, including X-ray sources, goniometers and detectors. Experimental errors, limitations and reproducibility are discussed. Various applications, from highly ordered inorganic single crystal surfaces to weakly ordered polymer thin films, are presented to illustrate the potential of GIXD. Data visualizations, representations and evaluation strategies are summarized, based on the example of anthracene thin films. The Primer compiles information relevant to perform high-quality GIXD experiments, evaluate data and interpret results, to extend knowledge about X-ray diffraction from surfaces, interfaces and thin films. Structures of surfaces and thin films can be investigated by performing X-ray diffraction under grazing incidence conditions. This Primer explores how grazing incidence X-ray diffraction is used to obtain crystallographic information, including in situ characterization, data collection, analysis and visualization, across a range of applications.

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掠入射条件下的 X 射线衍射
材料特性经常与表面或表面附近的结构有关,尤其是在薄膜中。因此,从分子和原子层面了解这些结构至关重要。X 射线衍射是表征晶体学秩序的最准确和最广泛使用的技术。在处理薄膜或界面时,单晶或粉末衍射等标准方法并不适用。不过,掠入射条件下的 X 射线衍射可以提供所需的信息。本《入门》全面介绍了掠入射 X 射线衍射 (GIXD),从晶体降维 X 射线衍射的基本考虑和 X 射线的光学特性开始,随后更深入地介绍了实验性能,包括 X 射线源、测角仪和探测器。还讨论了实验误差、局限性和可重复性。介绍了从高有序无机单晶表面到弱有序聚合物薄膜的各种应用,以说明 GIXD 的潜力。以蒽薄膜为例,总结了数据可视化、表示方法和评估策略。入门指南》汇集了进行高质量 GIXD 实验、评估数据和解释结果的相关信息,以扩展有关表面、界面和薄膜 X 射线衍射的知识。在掠入射条件下进行 X 射线衍射,可以研究表面和薄膜的结构。本入门手册探讨了如何利用掠入射 X 射线衍射获取晶体学信息,包括原位表征、数据收集、分析和可视化等一系列应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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