Crater radius analysis after dual droplets successive oblique impact on liquid film

IF 1.6 4区 化学 Q4 CHEMISTRY, PHYSICAL Surface and Interface Analysis Pub Date : 2024-03-03 DOI:10.1002/sia.7304
Minle Bao, Denghui Zhao, Luyuan Gong, Yali Guo, Shengqiang Shen
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Abstract

Droplet impact is a common occurrence in nature, agriculture, and industry. The research on the multi‐droplet impact is fundamental to understanding the tangled nature of reality. This paper numerically studies the successive oblique impact of dual droplets on the liquid film by building an effective three‐dimensional model. The leading and trailing droplets are set to pass a certain impact point with the same velocity. The main contribution of this paper is the investigation of the effects of Weber number, liquid film thickness, impact angle, and impact time interval on the interface morphology evolution after the droplet impact. Results show that splash pattern conversion of the primary or secondary crown occurs with the change of these factors. Besides, the variations of the maximum crater radius in upstream, lateral, and downstream directions with time are quantitatively analyzed. The crater radius analysis is carried out from three perspectives, the variation during the single droplet impact, the change during the dual droplets impact, and the comparison between them. It is found that the crater of dual droplets impact exhibits shape distortion in the deformation period and appears a marked dimensional increase in the secondary expansion period.
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双液滴连续斜撞击液膜后的凹坑半径分析
液滴撞击是自然界、农业和工业中经常发生的现象。对多液滴撞击的研究是理解现实纠结本质的基础。本文通过建立一个有效的三维模型,对双液滴对液膜的连续斜冲击进行了数值研究。设置前导液滴和后导液滴以相同的速度通过某一撞击点。本文的主要贡献在于研究了韦伯数、液膜厚度、撞击角度和撞击时间间隔对液滴撞击后界面形态演变的影响。结果表明,随着这些因素的变化,会发生主冠或次冠的飞溅形态转换。此外,还定量分析了最大弹坑半径在上游、横向和下游方向上随时间的变化。弹坑半径分析从三个角度进行:单液滴撞击时的变化、双液滴撞击时的变化以及它们之间的比较。结果发现,双液滴撞击的陨石坑在变形期表现出形状扭曲,在二次膨胀期出现明显的尺寸增大。
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来源期刊
Surface and Interface Analysis
Surface and Interface Analysis 化学-物理化学
CiteScore
3.30
自引率
5.90%
发文量
130
审稿时长
4.4 months
期刊介绍: Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal. Authors are invited to submit their papers for publication to John Watts (UK only), Jose Sanz (Rest of Europe), John T. Grant (all non-European countries, except Japan) or R. Shimizu (Japan only).
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