{"title":"Fraunhofer Diffraction Phenomena in the Coherent Light at an Extended Asymmetric Edge with a Reflecting (Gray) InnerFace","authors":"Yu. V. Chugui","doi":"10.3103/s8756699023050023","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Using the equivalent transparency models, the Fraunhofer diffraction phenomena in the coherent light are studied at an extended object with a constant thickness in the shape of a volumetric asymmetric edge with a bevel and a plane reflecting (gray) inner surface of the object characterized by the module of reflection coefficient and the phase shift in the reflected wave. It has been shown that the far-zone field can be represented in the form of two components: transmitted and reflected, the first of which corresponds to light diffraction at an absolutely absorbing asymmetric edge, while the second describes diffraction phenomena at the volumetric structure in the shape of a biplanar slot illuminated by a plane light wave. Based on the constructive approximation of the integral Fresnel function, an expression has been obtained for the object spectrum, which can be used to investigate the behavior of the far-zone fields. It has been shown that in the case of a large bevel, the main contribution to the field is made by the reflected component. The methods are proposed for determining geometric parameters of the object by measuring the position of the central maximum of the reflected component and its effective width.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"41 1","pages":""},"PeriodicalIF":0.5000,"publicationDate":"2024-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optoelectronics Instrumentation and Data Processing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3103/s8756699023050023","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
Using the equivalent transparency models, the Fraunhofer diffraction phenomena in the coherent light are studied at an extended object with a constant thickness in the shape of a volumetric asymmetric edge with a bevel and a plane reflecting (gray) inner surface of the object characterized by the module of reflection coefficient and the phase shift in the reflected wave. It has been shown that the far-zone field can be represented in the form of two components: transmitted and reflected, the first of which corresponds to light diffraction at an absolutely absorbing asymmetric edge, while the second describes diffraction phenomena at the volumetric structure in the shape of a biplanar slot illuminated by a plane light wave. Based on the constructive approximation of the integral Fresnel function, an expression has been obtained for the object spectrum, which can be used to investigate the behavior of the far-zone fields. It has been shown that in the case of a large bevel, the main contribution to the field is made by the reflected component. The methods are proposed for determining geometric parameters of the object by measuring the position of the central maximum of the reflected component and its effective width.
期刊介绍：
The scope of Optoelectronics, Instrumentation and Data Processing encompasses, but is not restricted to, the following areas: analysis and synthesis of signals and images; artificial intelligence methods; automated measurement systems; physicotechnical foundations of micro- and optoelectronics; optical information technologies; systems and components; modelling in physicotechnical research; laser physics applications; computer networks and data transmission systems. The journal publishes original papers, reviews, and short communications in order to provide the widest possible coverage of latest research and development in its chosen field.
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