A NUMERICAL ANALYSIS ON THE SUBMICRON- AND MICRON-SIZED PARTICLE SEDIMENTATION IN A WIRE-TO-PLATE ELECTROSTATIC PRECIPITATOR

Orcun Ekin
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Abstract

Electrostatic precipitators (ESPs) are frequently utilized in collecting fine organic and inorganic materials from continuous liquid with few moving parts and high efficiency using electrically charging the particles. In this study, cross-sectional 2D geometry of a wire-to-plate electrostatic precipitator the parametric data of which originally published elsewhere was numerically modeled and validated to investigate submicron-micron particle charging in terms of diffusion and field charging mechanisms and precipitation behavior of particles with detailed electric field properties. Electric field, gas flow, and particle trajectory equations are coupled and solved in a multiphysics solver. Particle tracking is realized with the Lagrangian approach. Results indicate variations in electric field strength and space charge density between corona electrodes, with space charge present in the entire precipitation channel. Between two different charging mechanisms, diffusion charging prevails for charge accumulated on submicron particles, whereas field charging becomes dominant for particles larger than 1μm diameter. However, for the ESP configuration considered in this study, particles reach a charge saturation in less than 0.7 seconds, regardless of their size. Although calculated precipitation efficiencies for micron-sized particles can reach to 100%, efficiencies for submicron particle range drop with increasing particle size, as diffusion charging rapidly loses its effectiveness, in 50-250nm range.
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线对板静电除尘器中亚微米和微米级颗粒沉降的数值分析
静电除尘器(ESP)常用于收集连续液体中的细小有机物和无机物,其运动部件少,利用电荷对颗粒充电效率高。本研究对线对板式静电除尘器的横截面二维几何形状进行了数值建模和验证,以研究亚微米级粒子的扩散和场充电机制,以及具有详细电场特性的粒子沉淀行为。电场、气体流动和粒子轨迹方程在多物理场求解器中耦合求解。利用拉格朗日方法实现了粒子跟踪。结果表明,电晕电极之间的电场强度和空间电荷密度存在变化,整个沉淀通道都存在空间电荷。在两种不同的充电机制之间,亚微米粒子上积累的电荷以扩散充电为主,而直径大于 1 微米的粒子则以场充电为主。不过,对于本研究中考虑的静电除尘器配置,无论颗粒大小如何,都能在不到 0.7 秒的时间内达到电荷饱和。虽然计算得出的微米级颗粒的沉淀效率可达 100%,但亚微米级颗粒的沉淀效率会随着颗粒尺寸的增加而下降,因为在 50-250 纳米范围内,扩散充电会迅速失去效果。
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