Julian Scharbert, Katharina Utesch, Thomas Reiter, Julian ter Horst, Maarten H. W. van Zalk, Mitja D Back, Richard Rau
{"title":"If you were happy and you know it, clap your hands! Testing the peak-end rule for retrospective judgments of well-being in everyday life","authors":"Julian Scharbert, Katharina Utesch, Thomas Reiter, Julian ter Horst, Maarten H. W. van Zalk, Mitja D Back, Richard Rau","doi":"10.1177/08902070241235969","DOIUrl":null,"url":null,"abstract":"The experience sampling method (ESM) and comparable assessment approaches are increasingly becoming popular tools for well-being research. In part, they are so popular because they represent more direct approaches for assessing individuals’ experienced well-being during a specified period, whereas one-time, retrospective evaluations of that episode are believed to introduce systematic biases. Along these lines, the peak-end rule states that the most extreme and recent sensations of an episode disproportionally influence retrospective well-being judgments. However, it has yet to be determined whether such systematic effects found in experimental laboratory studies generalize to retrospective judgments of well-being in everyday life as captured in ESM studies. Across four ESM samples (overall N = 1,889, total measurements = 131,575), we found that retrospective well-being judgments were disproportionately influenced by the peak and end experiences from the assessment period. However, these effects depended on the item framing of the retrospective judgment (global vs. more specific framings) and broad versus narrow conceptualizations of peaks and ends (states, days, and weeks), pointing toward potential ways to mitigate peak/end effects. Our findings emphasize the importance of differentiating between momentary and retrospective well-being assessments and selecting an appropriate measurement approach on the basis of these conceptual considerations.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"288 8‐9","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"102","ListUrlMain":"https://doi.org/10.1177/08902070241235969","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The experience sampling method (ESM) and comparable assessment approaches are increasingly becoming popular tools for well-being research. In part, they are so popular because they represent more direct approaches for assessing individuals’ experienced well-being during a specified period, whereas one-time, retrospective evaluations of that episode are believed to introduce systematic biases. Along these lines, the peak-end rule states that the most extreme and recent sensations of an episode disproportionally influence retrospective well-being judgments. However, it has yet to be determined whether such systematic effects found in experimental laboratory studies generalize to retrospective judgments of well-being in everyday life as captured in ESM studies. Across four ESM samples (overall N = 1,889, total measurements = 131,575), we found that retrospective well-being judgments were disproportionately influenced by the peak and end experiences from the assessment period. However, these effects depended on the item framing of the retrospective judgment (global vs. more specific framings) and broad versus narrow conceptualizations of peaks and ends (states, days, and weeks), pointing toward potential ways to mitigate peak/end effects. Our findings emphasize the importance of differentiating between momentary and retrospective well-being assessments and selecting an appropriate measurement approach on the basis of these conceptual considerations.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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