A thick wall concept for robust treatment of contacts in DEM simulation of highly polydisperse particulate systems

IF 2.5 Q3 BIOTECHNOLOGY & APPLIED MICROBIOLOGY Frontiers in chemical engineering Pub Date : 2024-03-14 DOI:10.3389/fceng.2024.1362466
F. O. Alfano, Giovanni Iozzi, F. P. Di Maio, A. Di Renzo
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Abstract

Modelling particulate systems with the Discrete Element Method (DEM) is an established practice, both in the representation and analysis of natural phenomena and in scale-up and optimization of industrial processes. Since the method allows tracking individual particles, each element can possess geometrical, physical, mechanical or chemical surface properties different from those of the other particles. One example is a polydisperse particulate system, i.e., characterized by a size distribution, opposed to the idealized monodisperse case. In conventional DEM, a softer particle stiffness is commonly adopted to reduce the computational time. It might happen that artificially soft particles, when colliding against a wall boundary, exhibit such large, unrealistic overlap that they “pass through” the wall and exit the domain. In the case of highly polydisperse systems, this often occurs when fine particles are pushed against the wall by coarse particles with masses several orders of magnitude larger. In the manuscript, a novel method is proposed, named thick wall, to allow the particles in contact with the walls to experience relatively large overlaps without ending up ejected out the domain. In particular, a careful way to calculate the particle-wall overlap and force unit vector can accommodate normal displacements larger than the maximum usually allowed, i.e., typically the particle radius, thereby preventing particles from being expelled from the domain. First, critical velocities for which single particles and pairs of fine/coarse particle escape the domain are analytically characterized using the linear and the Hertz models. The thick wall concept is then introduced and its effect on the maximum critical velocity is demonstrated with both contact models. Finally, application to pharmaceutical powder composed of carrier (coarse) and active pharmaceutical ingredient (API) (fine) particles in a shaken capsule prove this to be an example of vulnerability to the phenomenon of fine particle ejection and to significantly benefit from the thick wall modification.
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在对高度多分散颗粒系统进行 DEM 模拟时,采用厚壁概念对接触点进行稳健处理
使用离散元素法(DEM)对微粒系统进行建模,无论是在自然现象的表示和分析方面,还是在工业流程的放大和优化方面,都是一种成熟的做法。由于该方法可以跟踪单个颗粒,因此每个元素都可以拥有不同于其他颗粒的几何、物理、机械或化学表面特性。其中一个例子是多分散颗粒系统,即与理想化的单分散情况相反,具有粒度分布的特点。在传统的 DEM 中,通常采用较软的颗粒刚度来减少计算时间。可能出现的情况是,人工软颗粒在与墙壁边界碰撞时,会表现出很大的、不切实际的重叠,以至于 "穿过 "墙壁并离开域。在高度多分散系统中,当质量大几个数量级的粗颗粒将细颗粒推向壁时,往往会出现这种情况。手稿中提出了一种名为 "厚壁 "的新方法,可让与壁接触的颗粒经历相对较大的重叠,而不会最终被弹出域外。特别是,通过仔细计算粒子-壁重叠和力单位向量,可以容纳大于通常允许的最大法向位移,即通常的粒子半径,从而防止粒子被挤出畴。首先,使用线性模型和赫兹模型对单个颗粒和成对的细/粗颗粒逃离畴的临界速度进行了分析。然后引入厚壁概念,并用这两种接触模型证明其对最大临界速度的影响。最后,将其应用于摇动胶囊中由载体(粗颗粒)和活性药物成分(API)(细颗粒)组成的药粉,证明这是一个易受细颗粒喷出现象影响的例子,并能显著受益于厚壁改性。
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CiteScore
3.50
自引率
0.00%
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0
审稿时长
13 weeks
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