A tale of three failure-oriented-accelerated-test (FOAT) types and their roles in assuring aerospace electronics-and-photonics reliability: Perspective
{"title":"A tale of three failure-oriented-accelerated-test (FOAT) types and their roles in assuring aerospace electronics-and-photonics reliability: Perspective","authors":"E. Suhir","doi":"10.1016/j.jsse.2024.02.007","DOIUrl":null,"url":null,"abstract":"<div><p>Our “tale of three failure-oriented-accelerated-test (FOAT) types” includes (chronologically) 1) some product development tests (such as, e.g., shear-off or temperature cycling tests), 2) FOATs at the design stage (that should be applied, when a new technology, a new design or a new application of an existing aerospace electronic or a photonic product is considered, and suitable HALTs are not developed yet) and 3) Burn-in-tests (BITs). Their roles, significance and attributes are indicated and briefly discussed.</p></div>","PeriodicalId":37283,"journal":{"name":"Journal of Space Safety Engineering","volume":null,"pages":null},"PeriodicalIF":1.0000,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Space Safety Engineering","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2468896724000387","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, AEROSPACE","Score":null,"Total":0}
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Abstract
Our “tale of three failure-oriented-accelerated-test (FOAT) types” includes (chronologically) 1) some product development tests (such as, e.g., shear-off or temperature cycling tests), 2) FOATs at the design stage (that should be applied, when a new technology, a new design or a new application of an existing aerospace electronic or a photonic product is considered, and suitable HALTs are not developed yet) and 3) Burn-in-tests (BITs). Their roles, significance and attributes are indicated and briefly discussed.
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