S. Chichibu, Koji Okuno, M. Oya, Y. Saito, Hisanori Ishiguro, Tetsuya Takeuchi, Kohei Shima
{"title":"Operation-induced short-term degradation mechanisms of 275-nm-band AlGaN-based deep-ultraviolet light-emitting diodes on a sapphire substrate","authors":"S. Chichibu, Koji Okuno, M. Oya, Y. Saito, Hisanori Ishiguro, Tetsuya Takeuchi, Kohei Shima","doi":"10.1117/12.3000963","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":517866,"journal":{"name":"Light-Emitting Devices, Materials, and Applications XXVIII","volume":"1 2","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Light-Emitting Devices, Materials, and Applications XXVIII","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.3000963","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}