{"title":"Physics of the Sub-Monolayer Lubricant in the Head-Disk Interface","authors":"Kyosuke Ono","doi":"10.3390/lubricants12040117","DOIUrl":null,"url":null,"abstract":"This review presents a series of studies which have demonstrated that the diffusion characteristics of rarefied mobile lubricant films used in modern magnetic disks can be evaluated by a novel diffusion theory based on continuum mechanics, and that the meniscus force of the rarefied film is the major interaction force at the head-disk interface. The limitations of the conventional diffusion and disjoining pressure equations are first shown, and diffusion and disjoining pressure equations for rarefied liquid films are proposed, showing that the diffusion coefficient is in good agreement with the experiment. The experiment, in which glass spheres with radii of 1 and 2 mm collided with magnetic disks of different film thicknesses, showed that attraction similar to the pull-off forces of a static meniscus was measured only at the separation. Furthermore, mathematical analysis of the elastic meniscus contact between a sphere and a plane with a submonolayer liquid film showed that the maximum adhesion force is equal to the meniscus pull-off force and that the contact characteristics become similar to those of the JKR theory as the liquid film thickness decreases. A basic physical model of submonolayer liquid film is also proposed to justify the continuum mathematical equations.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"31 9","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.3390/lubricants12040117","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract
This review presents a series of studies which have demonstrated that the diffusion characteristics of rarefied mobile lubricant films used in modern magnetic disks can be evaluated by a novel diffusion theory based on continuum mechanics, and that the meniscus force of the rarefied film is the major interaction force at the head-disk interface. The limitations of the conventional diffusion and disjoining pressure equations are first shown, and diffusion and disjoining pressure equations for rarefied liquid films are proposed, showing that the diffusion coefficient is in good agreement with the experiment. The experiment, in which glass spheres with radii of 1 and 2 mm collided with magnetic disks of different film thicknesses, showed that attraction similar to the pull-off forces of a static meniscus was measured only at the separation. Furthermore, mathematical analysis of the elastic meniscus contact between a sphere and a plane with a submonolayer liquid film showed that the maximum adhesion force is equal to the meniscus pull-off force and that the contact characteristics become similar to those of the JKR theory as the liquid film thickness decreases. A basic physical model of submonolayer liquid film is also proposed to justify the continuum mathematical equations.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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