Direct Determination of Photonic Stopband Topological Character: A Framework Based on Dispersion Measurements

IF 3.7 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Advanced Photonics Research Pub Date : 2024-02-05 DOI:10.1002/adpr.202300155
Nitish Kumar Gupta, Sapireddy Srinivasu, Mukesh Kumar, Anjani Kumar Tiwari, Sudipta Sarkar Pal, Harshawardhan Wanare, S. Anantha Ramakrishna
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Abstract

Ascertainment of photonic stopband absolute topological character requires information regarding the Bloch eigenfunction spatial distribution. Consequently, the experimental investigations predominantly restrict themselves to the bulk-boundary correspondence principle and the ensuing emergence of topological surface state. Although capable of establishing the equivalence/inequivalence of bandgaps, the determination of their absolute topological identity remains out of its purview. The alternate method of reflection phase-based identification also provides only contentious improvements owing to the measurement complexities pertaining to the interferometric setups. To circumvent these limitations, the Kramers–Kronig amplitude-phase causality considerations are resorted to and an experimentally conducive method is proposed for bandgap topological character determination directly from the parametric reflectance measurements. Particularly, it is demonstrated that in case of 1D photonic crystals, polarization-resolved dispersion measurements suffice in qualitatively determining bandgaps’ absolute topological identities. By invoking the translational invariance of the investigated samples, a parameter “differential effective mass” is also defined, that encapsulates bandgaps’ topological identities and engenders an experimentally discernible bandgap classifier.

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直接确定光子止带拓扑特性:基于色散测量的框架
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