Yu-Jin Yan, Hai-Bo Li, Tong Zhao, Lin-Wang Wang, Lin Shi, Tao Liu, Guang-Ming Tan, Wei-Le Jia, Ning-Hui Sun
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引用次数: 0
Abstract
The growing demand for semiconductor devices simulation poses a big challenge for large-scale electronic structure calculations. Among various methods, the linearly scaling three-dimensional fragment (LS3DF) method exhibits excellent scalability in large-scale simulations. Based on algorithmic and system-level optimizations, we propose a highly scalable and highly efficient implementation of LS3DF on a domestic heterogeneous supercomputer equipped with accelerators. In terms of algorithmic optimizations, the original all-band conjugate gradient algorithm is refined to achieve faster convergence, and mixed precision computing is adopted to increase overall efficiency. In terms of system-level optimizations, the original two-layer parallel structure is replaced by a coarse-grained parallel method. Optimization strategies such as multi-stream, kernel fusion, and redundant computation removal are proposed to increase further utilization of the computational power provided by the heterogeneous machines. As a result, our optimized LS3DF can scale to a 10-million silicon atoms system, attaining a peak performance of 34.8 PFLOPS (21.2% of the peak). All the improvements can be adapted to the next-generation supercomputers for larger simulations.
期刊介绍:
Journal of Computer Science and Technology (JCST), the first English language journal in the computer field published in China, is an international forum for scientists and engineers involved in all aspects of computer science and technology to publish high quality and refereed papers. Papers reporting original research and innovative applications from all parts of the world are welcome. Papers for publication in the journal are selected through rigorous peer review, to ensure originality, timeliness, relevance, and readability. While the journal emphasizes the publication of previously unpublished materials, selected conference papers with exceptional merit that require wider exposure are, at the discretion of the editors, also published, provided they meet the journal''s peer review standards. The journal also seeks clearly written survey and review articles from experts in the field, to promote insightful understanding of the state-of-the-art and technology trends.
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