A Survey of Vision-Based Methods for Surface Defects’ Detection and Classification in Steel Products

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-04-23 DOI:10.3390/informatics11020025
A. A. M. S. Ibrahim, J. Tapamo
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Abstract

In the competitive landscape of steel-strip production, ensuring the high quality of steel surfaces is paramount. Traditionally, human visual inspection has been the primary method for detecting defects, but it suffers from limitations such as reliability, cost, processing time, and accuracy. Visual inspection technologies, particularly automation techniques, have been introduced to address these shortcomings. This paper conducts a thorough survey examining vision-based methodologies related to detecting and classifying surface defects on steel products. These methodologies encompass statistical, spectral, texture segmentation based methods, and machine learning-driven approaches. Furthermore, various classification algorithms, categorized into supervised, semi-supervised, and unsupervised techniques, are discussed. Additionally, the paper outlines the future direction of research focus.
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基于视觉的钢铁产品表面缺陷检测和分类方法概览
在竞争激烈的钢带生产中,确保钢带表面的高质量至关重要。传统上,人工视觉检测是检测缺陷的主要方法,但存在可靠性、成本、处理时间和准确性等局限性。为了解决这些问题,人们引入了视觉检测技术,特别是自动化技术。本文对基于视觉的钢铁产品表面缺陷检测和分类方法进行了深入研究。这些方法包括基于统计、光谱和纹理分割的方法,以及机器学习驱动的方法。此外,还讨论了各种分类算法,分为有监督、半监督和无监督技术。此外,本文还概述了未来的重点研究方向。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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