Spectral and Oscillation Theory for an Unconventional Fractional Sturm–Liouville Problem

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-04-19 DOI:10.3390/fractalfract8040238
Mohammad Dehghan, A. Mingarelli
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Abstract

Here, we investigate the spectral and oscillation theory for a class of fractional differential equations subject to specific boundary conditions. By transforming the problem into a modified version with a classical structure, we establish the orthogonality properties of eigenfunctions and some major comparison theorems for solutions. We also derive a new type of integration by using parts of formulas for modified fractional integrals and derivatives. Furthermore, we analyze the variational characterization of the first eigenvalue, revealing its non-zero first eigenfunction within the interior. Our findings demonstrate the potential for novel definitions of fractional derivatives to mirror the classical Sturm–Liouville theory through simple isospectral transformations.
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非常规分式 Sturm-Liouville 问题的频谱和振荡理论
在此,我们研究了一类受特定边界条件限制的分数微分方程的谱和振荡理论。通过将问题转化为具有经典结构的修正版本,我们建立了特征函数的正交特性和一些主要的解比较定理。我们还利用修正分数积分和导数的部分公式推导出一种新型积分。此外,我们还分析了第一特征值的变分特征,揭示了其内部的非零第一特征函数。我们的研究结果表明,通过简单的等谱变换,分数导数的新定义有可能反映经典的 Sturm-Liouville 理论。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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