Study of the Structural and Switching Properties of Ga2Te5 Crystals

A. Salwa, M. Nassary, H. Shaban, M. Gerges
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Abstract

The structural parameters of Ga2Te5 crystals grown using the Bridgman method have been studied. X-ray diffaction analysis revealed the crystal structure of Ga2Te5 in the tetragonal phase. In addition, crystalline size, strain, and dislocation density were calculated with the Sherrer model and the Williamson-Hall (W-H) model. The switching effect was achieved for Ga2Te5 crystals. Furthermore, the effect of temperature and light intensity was studied for Ga2Te5 crystals. The results show that temperature and light intensity affect switching characteristics such as threshold current (ith), threshold voltage (Vth), threshold power (Pth), and resistance ratios from a high-resistance OFF state to a low-resistance ON state (ROFF/RON).
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Ga2Te5 晶体的结构和开关特性研究
研究了使用布里奇曼法生长的 Ga2Te5 晶体的结构参数。X 射线衍射分析表明,Ga2Te5 的晶体结构为四方相。此外,还利用 Sherrer 模型和 Williamson-Hall (W-H) 模型计算了晶体尺寸、应变和位错密度。Ga2Te5 晶体实现了切换效应。此外,还研究了温度和光照强度对 Ga2Te5 晶体的影响。结果表明,温度和光照强度会影响开关特性,如阈值电流 (ith)、阈值电压 (Vth)、阈值功率 (Pth),以及从高电阻关断状态到低电阻接通状态的电阻比 (ROFF/RON)。
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