S. Usharani, R. Gayathri, Uday Surya Deveswar Reddy Kovvuri, Maddukuri Nivas, Abdul Quadir Md, Kong Fah Tee, A. K. Sivaraman
{"title":"An efficient approach for automatic crack detection using deep learning","authors":"S. Usharani, R. Gayathri, Uday Surya Deveswar Reddy Kovvuri, Maddukuri Nivas, Abdul Quadir Md, Kong Fah Tee, A. K. Sivaraman","doi":"10.1108/ijsi-10-2023-0102","DOIUrl":null,"url":null,"abstract":"PurposeAutomation of detecting cracked surfaces on buildings or in any industrially manufactured products is emerging nowadays. Detection of the cracked surface is a challenging task for inspectors. Image-based automatic inspection of cracks can be very effective when compared to human eye inspection. With the advancement in deep learning techniques, by utilizing these methods the authors can create automation of work in a particular sector of various industries.Design/methodology/approachIn this study, an upgraded convolutional neural network-based crack detection method has been proposed. The dataset consists of 3,886 images which include cracked and non-cracked images. Further, these data have been split into training and validation data. To inspect the cracks more accurately, data augmentation was performed on the dataset, and regularization techniques have been utilized to reduce the overfitting problems. In this work, VGG19, Xception and Inception V3, along with Resnet50 V2 CNN architectures to train the data.FindingsA comparison between the trained models has been performed and from the obtained results, Xception performs better than other algorithms with 99.54% test accuracy. The results show detecting cracked regions and firm non-cracked regions is very efficient by the Xception algorithm.Originality/valueThe proposed method can be way better back to an automatic inspection of cracks in buildings with different design patterns such as decorated historical monuments.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"62 3","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-04-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1108/ijsi-10-2023-0102","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
PurposeAutomation of detecting cracked surfaces on buildings or in any industrially manufactured products is emerging nowadays. Detection of the cracked surface is a challenging task for inspectors. Image-based automatic inspection of cracks can be very effective when compared to human eye inspection. With the advancement in deep learning techniques, by utilizing these methods the authors can create automation of work in a particular sector of various industries.Design/methodology/approachIn this study, an upgraded convolutional neural network-based crack detection method has been proposed. The dataset consists of 3,886 images which include cracked and non-cracked images. Further, these data have been split into training and validation data. To inspect the cracks more accurately, data augmentation was performed on the dataset, and regularization techniques have been utilized to reduce the overfitting problems. In this work, VGG19, Xception and Inception V3, along with Resnet50 V2 CNN architectures to train the data.FindingsA comparison between the trained models has been performed and from the obtained results, Xception performs better than other algorithms with 99.54% test accuracy. The results show detecting cracked regions and firm non-cracked regions is very efficient by the Xception algorithm.Originality/valueThe proposed method can be way better back to an automatic inspection of cracks in buildings with different design patterns such as decorated historical monuments.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico