Unveiling the non-innocence of vanadium dopant in TiO2 nanocrystals for advanced energy storage and smart windows

M. García‐Tecedor, I. Villar-García, Giulio Gorni, Marta Liras, V. A. de la Peña O'Shea, Mariam Barawi Moran
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Abstract

Vanadium doped TiO2 NCs stand out as a promising candidate for energy storage applications due to its high electrical conductivity and redox properties. However, the thermodynamical behavior of the material under working conditions has not been explored and the reasons for its superior performance remain unlocked. This study explores the use of a combination of advanced in situ spectroscopy techniques, including X-ray absorption spectroscopy (XAS), spectro-electrochemistry (SEC), and Electrochemical Impedance Spectroscopy (EIS) to provide unprecedented insights into the intricate electrochemical reaction mechanisms within these nanocrystals. Density functional theory calculations and EIS reveal the active role of substitutional V ions in the TiO2 anatase network as electron donors, enhancing surface charge and carrier density and improving pseudocapacitive properties. Cyclic voltammetry and in situ spectroelectrochemistry reveal that V-doped TiO2 NCs exhibit significantly improved charge storage capacities, particularly in the pseudo-capacitance storage mechanism. In situ SEC and XAS analyses indicate that a more effective reduction of Ti4+ ions occurs during the electrochemical process in doped NCs, leading to higher charge capacitance and faster processes. Furthermore, in situ XAS measurements of the V K-edge revealed that the vanadium ions, beyond improving the redox behavior of the host, also actively participate in the reduction process. The significant changes in the V K-edge XANES and EXAFS spectra observed under reduction conditions can be ascribed to a change in the structure and oxidation state of the vanadium ions during the electrochemical reaction.
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揭示 TiO2 纳米晶体中掺杂钒的非惰性,实现先进的能量存储和智能窗户
掺钒二氧化钛氮氧化物具有高导电性和氧化还原性,是储能应用的理想候选材料。然而,该材料在工作条件下的热力学行为尚未得到研究,其卓越性能的原因也尚未揭晓。本研究结合使用先进的原位光谱技术,包括 X 射线吸收光谱 (XAS)、光谱-电化学 (SEC) 和电化学阻抗光谱 (EIS),对这些纳米晶体内部错综复杂的电化学反应机制进行了前所未有的深入研究。密度泛函理论计算和电化学阻抗谱(EIS)揭示了二氧化钛锐钛矿网络中作为电子供体的取代型 V 离子的积极作用,它们增强了表面电荷和载流子密度,改善了伪电容特性。循环伏安法和原位光谱电化学分析表明,掺杂 V 离子的二氧化钛 NC 的电荷存储容量显著提高,尤其是在伪电容存储机制中。原位 SEC 和 XAS 分析表明,在掺杂 NC 的电化学过程中,Ti4+ 离子发生了更有效的还原,导致电荷电容更高,过程更快。此外,对 V K-edge 的原位 XAS 测量显示,钒离子除了改善宿主的氧化还原行为外,还积极参与了还原过程。在还原条件下观察到的 V K-edge XANES 和 EXAFS 光谱的明显变化可归因于电化学反应过程中钒离子结构和氧化态的变化。
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