{"title":"Flowback Rates for Pump-In/Flowback Test","authors":"Rui Wang, A. Dahi Taleghani, Yuzhe Cai","doi":"10.2118/219761-pa","DOIUrl":null,"url":null,"abstract":"\n The pump-in/flowback test (PIFT), often referred to as the diagnostic fracture injection test (DFIT) with flowback, offers notable advantages in terms of time efficiency and accuracy, particularly in the context of low-permeability formations. The key to the success of this test lies in the careful selection of an optimal flowback rate to yield meaningful results. The fundamental assumption underlying the pressure analysis of these tests is the uniform closure of fractures during the flowback phase, which is considered the default fracture closure mode in current analyses. In this study, we present evidence that challenges the validity of this assumption, highlighting instances where unsuitable flowback rates can lead to nonuniform fracture closure and result in abnormal pressure data. To address this challenge, we identify different closure modes through the signature of fracture closure in the excessive bottomhole pressure decline curve. Subsequently, we propose an optimal range of flowback rates using a scaling analysis approach to obtain a uniform closure mode in an extended openhole section of a vertical well. Our method has been rigorously validated through 3D numerical simulations and field studies, enhancing its reliability and applicability. This approach helps operators to conduct effective tests in complex situations, overcoming a barrier to widespread test application.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"127 ","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.2118/219761-pa","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The pump-in/flowback test (PIFT), often referred to as the diagnostic fracture injection test (DFIT) with flowback, offers notable advantages in terms of time efficiency and accuracy, particularly in the context of low-permeability formations. The key to the success of this test lies in the careful selection of an optimal flowback rate to yield meaningful results. The fundamental assumption underlying the pressure analysis of these tests is the uniform closure of fractures during the flowback phase, which is considered the default fracture closure mode in current analyses. In this study, we present evidence that challenges the validity of this assumption, highlighting instances where unsuitable flowback rates can lead to nonuniform fracture closure and result in abnormal pressure data. To address this challenge, we identify different closure modes through the signature of fracture closure in the excessive bottomhole pressure decline curve. Subsequently, we propose an optimal range of flowback rates using a scaling analysis approach to obtain a uniform closure mode in an extended openhole section of a vertical well. Our method has been rigorously validated through 3D numerical simulations and field studies, enhancing its reliability and applicability. This approach helps operators to conduct effective tests in complex situations, overcoming a barrier to widespread test application.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
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