Chu Wing So, Edwin Lok-hei Yuen, Edgar Heung Fat Leung, J. Pun
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引用次数: 0
Abstract
Here we present a proof of concept for the application of the Variance of Laplacian (VL) method in quantifying the sharpness of optical solar images. We conducted a comprehensive study using over 65,000 individual solar images acquired on more than 160 days. Each image underwent processing using a VL image processing algorithm, which assigns a “score” based on the sharpness of the solar disk’s edges. We studied the scores obtained from images acquired at different conditions. Our findings demonstrate that the sharpness of the images exhibits daily trends that are closely linked to the altitude of the Sun at the observation site. We observed a significant degradation in image quality only below a certain altitude threshold. Furthermore, we compared airmass formulae from the literature with our sharpness observations and concluded that the degradation could be modeled as an Image Sharpness Function (ISF), which exhibits similarities to airmass variations. In addition to assessing image quality, our method has the potential to evaluate the optical atmospheric conditions during daytime observations. Moreover, this technique can be easily and cost-effectively applied to archival or real-time images of other celestial bodies, such as the Moon, bright planets and defocused stars. Given that ISF is unique to each location and sensitive to sky conditions, the development of an ISF is not only beneficial for routine observation preparation but also essential for long-term site monitoring.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
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