Recap of the 29th Edition of the Asia and South Pacific Design Automation Conference (ASPDAC 2024)

IF 1.9 4区工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE IEEE Design & Test Pub Date : 2024-04-23 DOI:10.1109/mdat.2024.3371368

Taewhan Kim

引用次数: 0

Abstract

This Year, the 29th Asia and South Pacific Design Automation Conference (ASP-DAC 2024) was fully in-person after the COVID-19 pandemic. The conference was held from Monday, 22 January 2024 to Thursday, 25 January 2024, at Songdo Convention Center, Incheon, South Korea.

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第 29 届亚洲及南太平洋设计自动化大会（ASPDAC 2024）回顾

今年，第 29 届亚洲及南太平洋设计自动化大会（ASP-DAC 2024）在 COVID-19 大流行后全面采用现场会议的形式。会议于 2024 年 1 月 22 日（星期一）至 25 日（星期四）在韩国仁川松岛会议中心举行。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Design & Test COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC

CiteScore

3.80

自引率

5.00%

发文量

期刊介绍： IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

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