Direct Observation of Trace Elements in Barium Titanate of Multilayer Ceramic Capacitors Using Atom Probe Tomography.

IF 2.9 4区 工程技术 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY Microscopy and Microanalysis Pub Date : 2025-02-03 DOI:10.1093/mam/ozae032
Kyuseon Jang, Mi-Yang Kim, Chanwon Jung, Se-Ho Kim, Daechul Choi, Seong-Chan Park, Christina Scheu, Pyuck-Pa Choi
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Abstract

Accurately controlling trace additives in dielectric barium titanate (BaTiO3) layers is important for optimizing the performance of multilayer ceramic capacitors (MLCCs). However, characterizing the spatial distribution and local concentration of the additives, which strongly influence the MLCC performance, poses a significant challenge. Atom probe tomography (APT) is an ideal technique for obtaining this information, but the extremely low electrical conductivity and piezoelectricity of BaTiO3 render its analysis with existing sample preparation approaches difficult. In this study, we developed a new APT sample preparation method involving W coating and heat treatment to investigate the trace additives in the BaTiO3 layer of MLCCs. This method enables determination of the local concentration and distribution of all trace elements in the BaTiO3 layer, including additives and undesired impurities. The developed method is expected to pave the way for the further optimization and advancement of MLCC technology.

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利用原子探针断层扫描技术直接观察多层陶瓷电容器钛酸钡中的微量元素。
准确控制电介质钛酸钡(BaTiO3)层中的微量添加剂对于优化多层陶瓷电容器(MLCC)的性能非常重要。然而,添加剂的空间分布和局部浓度对多层陶瓷电容器的性能有很大影响,因此确定添加剂的特性是一项重大挑战。原子探针层析成像 (APT) 是获取这一信息的理想技术,但由于 BaTiO3 的导电率和压电性极低,因此很难利用现有的样品制备方法对其进行分析。在本研究中,我们开发了一种新的 APT 样品制备方法,包括 W 涂层和热处理,用于研究 MLCC 的 BaTiO3 层中的痕量添加剂。这种方法可以测定 BaTiO3 层中所有微量元素的局部浓度和分布,包括添加剂和不需要的杂质。所开发的方法有望为 MLCC 技术的进一步优化和进步铺平道路。
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来源期刊
Microscopy and Microanalysis
Microscopy and Microanalysis 工程技术-材料科学:综合
CiteScore
1.10
自引率
10.70%
发文量
1391
审稿时长
6 months
期刊介绍: Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.
期刊最新文献
In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View. An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy. Influence of the Emitter Shape on the Field-of-View in Atom Probe Tomography. Silica-embedded Gold Nanoparticles Analyzed by Atom Probe Tomography. Direct Observation of Trace Elements in Barium Titanate of Multilayer Ceramic Capacitors Using Atom Probe Tomography.
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