Muratha Sottatipreedawong, Ahad Ali Kazmi, Irene Vercellino
Ten years ago, the term "resolution revolution" was used for the first time to describe how cryogenic electron microscopy (cryo-EM) marked the beginning of a new era in the field of structural biology, enabling the investigation of previously unsolvable protein targets. The success of cryo-EM was recognized with the 2017 Chemistry Nobel Prize and has become a widely used method for the structural characterization of biological macromolecules, quickly catching up to x-ray crystallography. Bioenergetics is the division of biochemistry that studies the mechanisms of energy conversion in living organisms, strongly focused on the molecular machines (enzymes) that carry out these processes in cells. As bioenergetic enzymes can be arranged in complexes characterized by conformational heterogeneity/flexibility, they represent challenging targets for structural investigation by crystallography. Over the last decade, cryo-EM has therefore become a powerful tool to investigate the structure and function of bioenergetic complexes; here, we provide an overview of the main achievements enabled by the technique. We first summarize the features of cryo-EM and compare them to x-ray crystallography, and then, we present the exciting discoveries brought about by cryo-EM, particularly but not exclusively focusing on the oxidative phosphorylation system, which is a crucial energy-converting mechanism in humans.
十年前,"分辨率革命 "一词首次被用来描述低温电子显微镜(cryo-EM)如何标志着结构生物学领域一个新时代的开始,使研究以前无法解决的蛋白质目标成为可能。低温电子显微镜的成功获得了2017年化学诺贝尔奖,并已成为一种广泛应用于生物大分子结构表征的方法,迅速赶上了X射线晶体学。生物能学是生物化学的一个分支,主要研究生物体内的能量转换机制,重点关注细胞内执行这些过程的分子机器(酶)。由于生物能酶可以排列在具有构象异质性/灵活性特征的复合物中,因此它们是晶体学结构研究的挑战性目标。因此,在过去十年中,冷冻电镜已成为研究生物能复合物结构和功能的有力工具;在此,我们将概述该技术所取得的主要成就。我们首先总结了低温电子显微镜的特点,并将其与 X 射线晶体学进行了比较,然后介绍了低温电子显微镜带来的激动人心的发现,特别是但不限于氧化磷酸化系统,该系统是人类重要的能量转换机制。
{"title":"How Cryo-EM Revolutionized the Field of Bioenergetics.","authors":"Muratha Sottatipreedawong, Ahad Ali Kazmi, Irene Vercellino","doi":"10.1093/mam/ozae089","DOIUrl":"10.1093/mam/ozae089","url":null,"abstract":"<p><p>Ten years ago, the term \"resolution revolution\" was used for the first time to describe how cryogenic electron microscopy (cryo-EM) marked the beginning of a new era in the field of structural biology, enabling the investigation of previously unsolvable protein targets. The success of cryo-EM was recognized with the 2017 Chemistry Nobel Prize and has become a widely used method for the structural characterization of biological macromolecules, quickly catching up to x-ray crystallography. Bioenergetics is the division of biochemistry that studies the mechanisms of energy conversion in living organisms, strongly focused on the molecular machines (enzymes) that carry out these processes in cells. As bioenergetic enzymes can be arranged in complexes characterized by conformational heterogeneity/flexibility, they represent challenging targets for structural investigation by crystallography. Over the last decade, cryo-EM has therefore become a powerful tool to investigate the structure and function of bioenergetic complexes; here, we provide an overview of the main achievements enabled by the technique. We first summarize the features of cryo-EM and compare them to x-ray crystallography, and then, we present the exciting discoveries brought about by cryo-EM, particularly but not exclusively focusing on the oxidative phosphorylation system, which is a crucial energy-converting mechanism in humans.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142291233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Intensities in high-resolution phase-contrast images from electron microscopes build up discretely in time by detecting single electrons. A wave description of pulse-like coherent-inelastic interaction of an electron with matter implies a time-dependent coexistence of coherent partial waves. Their superposition forms a wave package by phase decoherence of 0.5 - 1 radian with Heisenbergs energy uncertainty ΔEH = ħ/2 Δt-1 matching the energy loss ΔE of a coherent-inelastic interaction and sets the interaction time Δt. In these circumstances, the product of Planck's constant and the speed of light hc is given by the product of the expression for temporal coherence λ2/Δλ and the energy loss ΔE. Experimentally, the self-coherence length was measured by detecting the energy-dependent localization of scattered, plane matter waves in surface proximity exploiting the Goos-Hänchen shift. Chromatic-aberration Cc-corrected electron microscopy on boron nitride (BN) proves that the coherent crystal illumination and phase contrast are lost if the self-coherence length shrinks below the size of the crystal unit cell at ΔE > 200 eV. In perspective, the interaction time of any matter wave compares with the lifetime of a virtual particle of any elemental interaction, suggesting the present concept of coherent-inelastic interactions of matter waves might be generalizable.
电子显微镜通过检测单个电子,在高分辨率相位对比图像中形成离散的时间强度。对电子与物质的脉冲式相干非弹性相互作用的波描述意味着相干部分波的时间共存。它们的叠加通过相位退相干形成一个 0.5 - 1 弧度的波包,其海森堡能量不确定性ΔEH = ħ/2 Δt-1与相干-非弹性相互作用的能量损失ΔE相匹配,并设定了相互作用时间Δt。在这种情况下,普朗克常数与光速 hc 的乘积就是时间相干性表达式 λ2/Δλ 与能量损失 ΔE 的乘积。在实验中,利用 Goos-Hänchen 偏移,通过检测散射平面物质波在表面附近随能量变化的定位来测量自相干长度。氮化硼(BN)上的色差 Cc 校正电子显微镜证明,如果自相干长度在 ΔE > 200 eV 时缩小到晶体单元尺寸以下,就会失去相干晶体照明和相位对比。从这个角度来看,任何物质波的相互作用时间与任何元素相互作用的虚拟粒子的寿命相比较,表明目前物质波的相干-非弹性相互作用概念可能是可推广的。
{"title":"Single Electron Self-coherence and Its Wave/Particle Duality in the Electron Microscope.","authors":"C Kisielowski, P Specht, J R Jinschek, S Helveg","doi":"10.1093/mam/ozae107","DOIUrl":"10.1093/mam/ozae107","url":null,"abstract":"<p><p>Intensities in high-resolution phase-contrast images from electron microscopes build up discretely in time by detecting single electrons. A wave description of pulse-like coherent-inelastic interaction of an electron with matter implies a time-dependent coexistence of coherent partial waves. Their superposition forms a wave package by phase decoherence of 0.5 - 1 radian with Heisenbergs energy uncertainty ΔEH = ħ/2 Δt-1 matching the energy loss ΔE of a coherent-inelastic interaction and sets the interaction time Δt. In these circumstances, the product of Planck's constant and the speed of light hc is given by the product of the expression for temporal coherence λ2/Δλ and the energy loss ΔE. Experimentally, the self-coherence length was measured by detecting the energy-dependent localization of scattered, plane matter waves in surface proximity exploiting the Goos-Hänchen shift. Chromatic-aberration Cc-corrected electron microscopy on boron nitride (BN) proves that the coherent crystal illumination and phase contrast are lost if the self-coherence length shrinks below the size of the crystal unit cell at ΔE > 200 eV. In perspective, the interaction time of any matter wave compares with the lifetime of a virtual particle of any elemental interaction, suggesting the present concept of coherent-inelastic interactions of matter waves might be generalizable.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142623907","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Arka Mandal, Benoît Beausir, Julien Guyon, Vincent Taupin, Antoine Guitton
Characterizing threading dislocations (TDs) in gallium nitride (GaN) semiconductors is crucial for ensuring the reliability of semiconductor devices. The current research addresses this issue by combining two techniques using a scanning electron microscope, namely electron channeling contrast imaging (ECCI) and high-resolution electron backscattered diffraction (HR-EBSD). It is a comparative study of these techniques to underscore how they perform in the evaluation of TD densities in GaN epitaxial layers. Experiments reveal that the dislocation line vectors mostly deviate from the growth direction of the film, i.e., ∦ [0001], followed by edge-type dislocations (dislocation lines || [0001]) with insignificant screw character. Furthermore, TDs from the dislocation clusters are characterized as edge- and (edge + mixed)-type TDs. By combining ECCI counting of dislocations and HR-EBSD description of geometrically necessary dislocation density type, it is possible to measure the total TD density and provide the proportion of pure (edge and screw) and mixed TDs. It has also been observed from the analyses of residual elastic strain fields and lattice rotations that it is not possible to identify individual dislocations for the spatial resolution of 50 nm in HR-EBSD. Nevertheless, ECCI and HR-EBSD can be complementarily used to count and characterize the TDs.
{"title":"Estimation of Dislocation Densities With Nondestructive Scanning Electron Microscope Techniques: Application to Gallium Nitride.","authors":"Arka Mandal, Benoît Beausir, Julien Guyon, Vincent Taupin, Antoine Guitton","doi":"10.1093/mam/ozae124","DOIUrl":"10.1093/mam/ozae124","url":null,"abstract":"<p><p>Characterizing threading dislocations (TDs) in gallium nitride (GaN) semiconductors is crucial for ensuring the reliability of semiconductor devices. The current research addresses this issue by combining two techniques using a scanning electron microscope, namely electron channeling contrast imaging (ECCI) and high-resolution electron backscattered diffraction (HR-EBSD). It is a comparative study of these techniques to underscore how they perform in the evaluation of TD densities in GaN epitaxial layers. Experiments reveal that the dislocation line vectors mostly deviate from the growth direction of the film, i.e., ∦ [0001], followed by edge-type dislocations (dislocation lines || [0001]) with insignificant screw character. Furthermore, TDs from the dislocation clusters are characterized as edge- and (edge + mixed)-type TDs. By combining ECCI counting of dislocations and HR-EBSD description of geometrically necessary dislocation density type, it is possible to measure the total TD density and provide the proportion of pure (edge and screw) and mixed TDs. It has also been observed from the analyses of residual elastic strain fields and lattice rotations that it is not possible to identify individual dislocations for the spatial resolution of 50 nm in HR-EBSD. Nevertheless, ECCI and HR-EBSD can be complementarily used to count and characterize the TDs.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142979172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Retraction of: Automated Tools to Advance High-Resolution Imaging in Liquid.","authors":"","doi":"10.1093/mam/ozae128","DOIUrl":"10.1093/mam/ozae128","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143008040","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Christopher Leist, Max Makurat, Andy Jiao, Xue Liu, Grégory F Schneider, Ute Kaiser
In this study, we explore the dynamics of grain boundaries in nanocrystalline carbon monolayers, focusing on their variation with electron beam energy and electron dose rate in a spherical and chromatic aberration-corrected transmission electron microscope. We demonstrate that a clean surface, a high-dose rate, and a 60 keV electron beam are essential for precise local control over the dynamics of grain boundaries. The structure of these linear defects has been evaluated using neural network-generated polygon mapping.
{"title":"Control of Grain Boundary Formation in Atomically Resolved Nanocrystalline Carbon Monolayers: Dependence on Electron Energy.","authors":"Christopher Leist, Max Makurat, Andy Jiao, Xue Liu, Grégory F Schneider, Ute Kaiser","doi":"10.1093/mam/ozae101","DOIUrl":"10.1093/mam/ozae101","url":null,"abstract":"<p><p>In this study, we explore the dynamics of grain boundaries in nanocrystalline carbon monolayers, focusing on their variation with electron beam energy and electron dose rate in a spherical and chromatic aberration-corrected transmission electron microscope. We demonstrate that a clean surface, a high-dose rate, and a 60 keV electron beam are essential for precise local control over the dynamics of grain boundaries. The structure of these linear defects has been evaluated using neural network-generated polygon mapping.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142469821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern transmission electron microscopy. This is especially true for life science imaging, where the sample, rather than the instrument, still determines the resolution limit. Here, we explore whether we have to accept this or can progress further in this area. To do this, we use numerical simulations to see how much information we can obtain from a weak phase object at different electron doses. Starting from a model with four phase values, we compare Zernike phase contrast with measuring diffracted intensity under multiple random phase illuminations to solve the inverse problem. Our simulations have shown that diffraction-based methods perform better than the Zernike method, as we have found and addressed a normalization issue that, in some other studies, led to an overly optimistic representation of the Zernike setup. We further validated this using more realistic 2D objects and found that random phase illuminated diffraction can be up to five times more efficient than an ideal Zernike implementation. These findings suggest that diffraction-based methods could be a promising approach for imaging beam-sensitive materials and that current low-dose imaging methods are not yet at the quantum limit.
{"title":"Retrieval of Phase Information from Low-Dose Electron Microscopy Experiments: Are We at the Limit Yet?","authors":"Francisco Vega Ibáñez, Jo Verbeeck","doi":"10.1093/mam/ozae125","DOIUrl":"10.1093/mam/ozae125","url":null,"abstract":"<p><p>The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern transmission electron microscopy. This is especially true for life science imaging, where the sample, rather than the instrument, still determines the resolution limit. Here, we explore whether we have to accept this or can progress further in this area. To do this, we use numerical simulations to see how much information we can obtain from a weak phase object at different electron doses. Starting from a model with four phase values, we compare Zernike phase contrast with measuring diffracted intensity under multiple random phase illuminations to solve the inverse problem. Our simulations have shown that diffraction-based methods perform better than the Zernike method, as we have found and addressed a normalization issue that, in some other studies, led to an overly optimistic representation of the Zernike setup. We further validated this using more realistic 2D objects and found that random phase illuminated diffraction can be up to five times more efficient than an ideal Zernike implementation. These findings suggest that diffraction-based methods could be a promising approach for imaging beam-sensitive materials and that current low-dose imaging methods are not yet at the quantum limit.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142979179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Leeches are widely used as model organisms in scientific studies and medical treatments. Medical leeches are hematophagous parasites that usually feed on the blood of their hosts. Some leeches show deformities, usually after feeding. This causes both medical and economic losses as it reduces the effectiveness of leeches in cultivation and medical treatment. The aim of this study was to investigate the effects of morphological deformations after feeding in Hirudo verbana, Carena 1820 (Annelida, Hirudinea), an important species in medical leech treatments. For this purpose, both histopathological and scanning electron microscopy examinations of starved and fed leeches were performed. The causes of deformities in medical leeches were found to be due to overfeeding, which caused cracks on the intestinal surface and therefore deterioration of the tissues. It is also thought that the immunological agents in the fed blood destroyed the medical leech tissue in these regions. In addition, it was determined that the cellular structure of the shaped blood elements stored in the cavity after feeding was preserved for a long time (months) without deterioration. It is certain that revealing the mechanism by which this occurs will inspire the preservation of blood for a long time in blood transfusion.
{"title":"Morphological and Anatomical Deformities of Hirudo verbana, Carena 1820 (Annelida, Hirudinea) After Feeding: Light and Electron Microscopic Analysis.","authors":"Özmen Ülger, Huseyin Ayhan","doi":"10.1093/mam/ozae136","DOIUrl":"10.1093/mam/ozae136","url":null,"abstract":"<p><p>Leeches are widely used as model organisms in scientific studies and medical treatments. Medical leeches are hematophagous parasites that usually feed on the blood of their hosts. Some leeches show deformities, usually after feeding. This causes both medical and economic losses as it reduces the effectiveness of leeches in cultivation and medical treatment. The aim of this study was to investigate the effects of morphological deformations after feeding in Hirudo verbana, Carena 1820 (Annelida, Hirudinea), an important species in medical leech treatments. For this purpose, both histopathological and scanning electron microscopy examinations of starved and fed leeches were performed. The causes of deformities in medical leeches were found to be due to overfeeding, which caused cracks on the intestinal surface and therefore deterioration of the tissues. It is also thought that the immunological agents in the fed blood destroyed the medical leech tissue in these regions. In addition, it was determined that the cellular structure of the shaped blood elements stored in the cavity after feeding was preserved for a long time (months) without deterioration. It is certain that revealing the mechanism by which this occurs will inspire the preservation of blood for a long time in blood transfusion.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142979176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Xiao-Han Li, Song-Hee Lee, Ji-Dam Kim, Gyu-Hyun Lee, Jae-Min Sim, Xiang-Shun Cui
The pluripotency-related T-box family transcription factor TBX3 maintains mESC self-renewal and plays a key role in the development of several tissues, including the heart, mammary glands, limbs, and lungs. However, the role of TBX3 during porcine preimplantation embryo development remains unclear. In our research, TBX3 was knocked down by injecting dsRNA to explore the function of TBX3. TBX3 expression gradually increases during early embryonic development. TBX3 knockdown resulted in decreased in the rate of four-cell and blastocyst. Depletion of TBX3 decreased the level of H3K9Ac/H3K27Ac and decreased ZGA gene expression at the four-cell stage. Furthermore, TBX3 knockdown led to a decrease in ZSACN4 protein level, DNMT1 and intracellular 5mc levels were increased, and then induced telomeres shorten and DNA damaged. Additionally, TBX3 knockdown significantly decreased histone acetylation and pluripotency genes NANOG/OCT4 expression in blastocysts. TBX3 knockdown induced apoptosis in blastocysts. Taken together, TBX3 regulate histone acetylation and play important roles in zygotic genome activation and early embryonic development in pigs.
{"title":"TBX3 is Essential for Zygotic Genome Activation and Embryonic Development in Pigs.","authors":"Xiao-Han Li, Song-Hee Lee, Ji-Dam Kim, Gyu-Hyun Lee, Jae-Min Sim, Xiang-Shun Cui","doi":"10.1093/mam/ozae123","DOIUrl":"10.1093/mam/ozae123","url":null,"abstract":"<p><p>The pluripotency-related T-box family transcription factor TBX3 maintains mESC self-renewal and plays a key role in the development of several tissues, including the heart, mammary glands, limbs, and lungs. However, the role of TBX3 during porcine preimplantation embryo development remains unclear. In our research, TBX3 was knocked down by injecting dsRNA to explore the function of TBX3. TBX3 expression gradually increases during early embryonic development. TBX3 knockdown resulted in decreased in the rate of four-cell and blastocyst. Depletion of TBX3 decreased the level of H3K9Ac/H3K27Ac and decreased ZGA gene expression at the four-cell stage. Furthermore, TBX3 knockdown led to a decrease in ZSACN4 protein level, DNMT1 and intracellular 5mc levels were increased, and then induced telomeres shorten and DNA damaged. Additionally, TBX3 knockdown significantly decreased histone acetylation and pluripotency genes NANOG/OCT4 expression in blastocysts. TBX3 knockdown induced apoptosis in blastocysts. Taken together, TBX3 regulate histone acetylation and play important roles in zygotic genome activation and early embryonic development in pigs.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142979180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jun Takahashi, Kazuto Kawakami, Naoyoshi Kubota, Takae Jinnai
To identify the origin of high intensities of BO2- signals on grain boundaries (GBs) in boron (B) mapping using secondary-ion mass spectrometry (SIMS), atom probe tomography analysis was performed on high-brightness GBs in the steel with the addition of B. Homogeneous segregation of B atoms as a solid solution, rather than continuous GB precipitation of fine boride, was observed at the GBs. The amounts of B segregation varied between the GBs. An estimation of the incident angle of the GB from the sample surface in each GB indicated that the high-brightness GBs always have smaller incident angles than the median angle under the assumption of random GB orientation, resulting in an increase in the GB area in the SIMS analyzed region. The product of the actual B segregation amount and area increase factor roughly corresponded to the apparent B intensity of the GB in B-mapping with SIMS. The high brightness in the B-mapping originated mainly from small incident angles of GB from the sample surface in the steel. The incident angle of the GB plane must be considered for quantification of GB segregation of B in the SIMS analysis.
{"title":"Quantitative Analysis of Grain Boundary Segregation of Boron in Steel with Secondary-Ion Mass Spectrometry in Comparison to Atom Probe Tomography.","authors":"Jun Takahashi, Kazuto Kawakami, Naoyoshi Kubota, Takae Jinnai","doi":"10.1093/mam/ozae137","DOIUrl":"10.1093/mam/ozae137","url":null,"abstract":"<p><p>To identify the origin of high intensities of BO2- signals on grain boundaries (GBs) in boron (B) mapping using secondary-ion mass spectrometry (SIMS), atom probe tomography analysis was performed on high-brightness GBs in the steel with the addition of B. Homogeneous segregation of B atoms as a solid solution, rather than continuous GB precipitation of fine boride, was observed at the GBs. The amounts of B segregation varied between the GBs. An estimation of the incident angle of the GB from the sample surface in each GB indicated that the high-brightness GBs always have smaller incident angles than the median angle under the assumption of random GB orientation, resulting in an increase in the GB area in the SIMS analyzed region. The product of the actual B segregation amount and area increase factor roughly corresponded to the apparent B intensity of the GB in B-mapping with SIMS. The high brightness in the B-mapping originated mainly from small incident angles of GB from the sample surface in the steel. The incident angle of the GB plane must be considered for quantification of GB segregation of B in the SIMS analysis.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143189928","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
2D elemental imaging techniques such as micro-X-ray fluorescence (micro-XRF) and micro-particle-induced X-ray emission (micro-PIXE) play a critical role in elemental mapping across diverse fields such as biology, geology, materials science, and engineering. However, surface irregularities often introduce shadow effects, hindering accurate spectrometric analysis. Knowing the topography information is essential for addressing this issue. Here, we propose integrating a global least squares algorithm for reconstructing the 3D surface topography in micro-PIXE analysis which is applicable in other similar techniques based on X-ray microscopy. This algorithm utilizes two independent gradient components, distorted by noise, to calculate the gradient vector from X-ray data acquired by an annular quad-segment spectrometer. We demonstrate the capability of this approach on a real homogeneous sample, yielding 3D elemental surface topography. This noniterative code provides surface reconstructions which in turn could find application to enhance the correction of spatial elemental distributions across heterogeneous sample types.
{"title":"Global Least Squares Algorithm for 3D Elemental Surface Topography Reconstruction Using Quad-Segment Detector in X-ray Spectrometry.","authors":"Ebrahim Gholami Hatam, Primož Pelicon","doi":"10.1093/mam/ozae138","DOIUrl":"10.1093/mam/ozae138","url":null,"abstract":"<p><p>2D elemental imaging techniques such as micro-X-ray fluorescence (micro-XRF) and micro-particle-induced X-ray emission (micro-PIXE) play a critical role in elemental mapping across diverse fields such as biology, geology, materials science, and engineering. However, surface irregularities often introduce shadow effects, hindering accurate spectrometric analysis. Knowing the topography information is essential for addressing this issue. Here, we propose integrating a global least squares algorithm for reconstructing the 3D surface topography in micro-PIXE analysis which is applicable in other similar techniques based on X-ray microscopy. This algorithm utilizes two independent gradient components, distorted by noise, to calculate the gradient vector from X-ray data acquired by an annular quad-segment spectrometer. We demonstrate the capability of this approach on a real homogeneous sample, yielding 3D elemental surface topography. This noniterative code provides surface reconstructions which in turn could find application to enhance the correction of spatial elemental distributions across heterogeneous sample types.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143189917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}