A. N. Dudin, V. Yu. Yurina, V. V. Neshchimenko, M. M. Mikhailov, S. A. Yuriev, A. N. Lapin
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引用次数: 0
Abstract
A comparative analysis of the diffuse reflectance spectra and their changes after irradiation with electrons with an energy of 30 keV of coatings based on polymethylphenylsiloxane resin and pigment powders of two-layer hollow ZnO/SiO2 particles is carried out. The analysis is performed in situ in the range of 250–2500 nm. The samples are irradiated using a Spectrum space-conditions simulator. The radiation resistance of the studied coatings based on two-layer hollow ZnO/SiO2 particles is estimated relative to coatings based on ZnO polycrystals by analyzing the difference diffuse reflectance spectra obtained by subtracting the spectra after irradiation from the spectra of the unirradiated samples. It is found that the intensity of the induced absorption bands in coatings based on hollow ZnO/SiO2 particles is less than in coatings based on ZnO microparticles, and the radiation resistance when estimating changes in the integral absorption coefficient of solar radiation (ΔαS) is twice as high. The increase in the radiation resistance is probably determined by the different nature of defect accumulation: in the case of solid microparticles, defects can accumulate inside grains; in hollow particles, the accumulation of defects can occur only within the thin shell of the sphere.
期刊介绍：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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