Temperature Dependence of the Kinetics of Domain-Structure Transformation in Heterophase Co/Pt/Co Films

V. S. Gornakov, I. V. Shashkov, Yu. P. Kabanov
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Abstract

Using Kerr microscopy, the effect of temperature on the displacement of domain boundaries in ultrathin exchange-coupled ferromagnetic layers in heterophase Pt/Co/Pt/Co/Pt films with perpendicular magnetic anisotropy and a nonmagnetic wedge-shaped spacer layer is experimentally studied. The exchange interaction between the Co layers is investigated for spacer-layer thicknesses ranging from 5 to 6 nm within the temperature range of 200 to 300 K. The independent displacement of domain boundaries in the Co layers under the action of a perpendicular magnetic field applied to the sample surface occurs within the range of thicknesses d0 < d < dCR. Throughout the entire temperature range, the displacement of domain boundaries along the Pt wedge results in their stabilization in an equilibrium position. This position depends on the magnitude of the applied field, the thickness of the nonmagnetic spacer layer, and temperature. It is determined by the balance of forces acting on the boundary, including the external field, the effective exchange field between the Co layers, and the coercivity field. Upon the removal of the external field, the domain boundaries relax to the initial state with d = d0 due to the effect of the exchange field. The characteristics of this relaxation depend on the temperature. The study of the mechanism of domain-boundary stabilization near dCR reveal that the critical thickness of the nonmagnetic spacer layer dCR and the coercivity field exhibit oppositely directed dependences on temperature.

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异相 Co/Pt/Co 薄膜中域-结构转变动力学的温度依赖性
摘要 利用克尔显微镜,实验研究了温度对具有垂直磁各向异性和非磁性楔形间隔层的异相铂/钴/铂/钴/铂薄膜中超薄交换耦合铁磁层域界位移的影响。在厚度为 d0 < d < dCR 的范围内,在施加于样品表面的垂直磁场作用下,Co 层的畴界发生独立位移。在整个温度范围内,畴界沿铂楔的位移导致它们稳定在一个平衡位置。这个位置取决于外加磁场的大小、非磁性间隔层的厚度和温度。它是由作用在边界上的力的平衡决定的,包括外场、Co 层之间的有效交换场和矫顽力场。移除外场后,由于交换场的作用,畴界会松弛到 d = d0 的初始状态。这种弛豫的特征取决于温度。对 dCR 附近畴界稳定机制的研究表明,非磁性间隔层的临界厚度 dCR 和矫顽力场对温度的依赖性是相反的。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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