{"title":"Electromagnetic Radiation of Accelerated Electron Beams During Sliding Interaction with a Dielectric Surface","authors":"L. A. Zhilyakov, V. S. Kulikauskas","doi":"10.1134/S102745102402040X","DOIUrl":null,"url":null,"abstract":"<p>The work is aimed at studying the properties of the “guiding” effect, namely the possibility of generating electromagnetic radiation when guiding beams of accelerated electrons. In this paper, we discuss a model of motion for the case of electron guiding during the interaction of electron beams with a dielectric surface. It is noted that when an electron beam is pressed against the surface of a dielectric by an external transverse electric field, in this case, due to the guiding effect, the electrons experience transverse vibrations when moving along the surface. Consequently, the movement of electrons in the transverse direction is accelerated and, accordingly, electron beams in the case of guiding should be a source of electromagnetic radiation, similar to the radiation of undulators and wigglers. The numerical estimates carried out in the work using the Larmor formula show that the power of this radiation should have a value sufficient for its experimental detection. This radiation should be of a pulsed nature against the background of continuous radiation. The power of the pulsed radiation must be several orders of magnitude greater than the power of the continuous background radiation.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 2","pages":"424 - 427"},"PeriodicalIF":0.5000,"publicationDate":"2024-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S102745102402040X","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The work is aimed at studying the properties of the “guiding” effect, namely the possibility of generating electromagnetic radiation when guiding beams of accelerated electrons. In this paper, we discuss a model of motion for the case of electron guiding during the interaction of electron beams with a dielectric surface. It is noted that when an electron beam is pressed against the surface of a dielectric by an external transverse electric field, in this case, due to the guiding effect, the electrons experience transverse vibrations when moving along the surface. Consequently, the movement of electrons in the transverse direction is accelerated and, accordingly, electron beams in the case of guiding should be a source of electromagnetic radiation, similar to the radiation of undulators and wigglers. The numerical estimates carried out in the work using the Larmor formula show that the power of this radiation should have a value sufficient for its experimental detection. This radiation should be of a pulsed nature against the background of continuous radiation. The power of the pulsed radiation must be several orders of magnitude greater than the power of the continuous background radiation.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.