{"title":"Electron–Plasmon Interaction in Bi2Te3–Sb2Te3 Crystals","authors":"N. P. Stepanov","doi":"10.1134/s1027451024020381","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Upon studying the optical properties of solid solutions of <i>p</i>-type Bi<sub>2</sub>Te<sub>3</sub>–Sb<sub>2</sub>Te<sub>3</sub> in the infrared range, it is found that in the single crystal Bi<sub>0.6</sub>Sb<sub>1.4</sub>Te<sub>3</sub>, deformation of the reflection-coefficient spectra is observed in the frequency range of observation of the plasma resonance of free charge carriers. Deformation of the plasma edge increases with a decrease in temperature. Using the Kramers–Kronig dispersion relations from experimental reflection spectra, the spectral dependences of the real ε<sub>1</sub> and imaginary parts ε<sub>2</sub> of the permittivity function, as well as the energy-loss function characterizing the rate of energy dissipation, are calculated. Splitting of the peak of the energy loss function is found, which indicates the effect on the plasma resonance from another process occurring in the electronic system. It is established that such a process is the transition of electrons between nonequivalent extrema of the valence band. Convergence of the collective and single-particle energies of the electronic system leads to amplification of the electron—plasmon interaction, which is the most probable cause of the observed deformation of the plasma edge.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":null,"pages":null},"PeriodicalIF":0.5000,"publicationDate":"2024-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1134/s1027451024020381","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
Upon studying the optical properties of solid solutions of p-type Bi2Te3–Sb2Te3 in the infrared range, it is found that in the single crystal Bi0.6Sb1.4Te3, deformation of the reflection-coefficient spectra is observed in the frequency range of observation of the plasma resonance of free charge carriers. Deformation of the plasma edge increases with a decrease in temperature. Using the Kramers–Kronig dispersion relations from experimental reflection spectra, the spectral dependences of the real ε1 and imaginary parts ε2 of the permittivity function, as well as the energy-loss function characterizing the rate of energy dissipation, are calculated. Splitting of the peak of the energy loss function is found, which indicates the effect on the plasma resonance from another process occurring in the electronic system. It is established that such a process is the transition of electrons between nonequivalent extrema of the valence band. Convergence of the collective and single-particle energies of the electronic system leads to amplification of the electron—plasmon interaction, which is the most probable cause of the observed deformation of the plasma edge.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.