Determine Multilayers Coating Dispersive Properties Using Statistical Parameters

IF 0.5 Q4 PHYSICS, MULTIDISCIPLINARY Optoelectronics Instrumentation and Data Processing Pub Date : 2024-05-03 DOI:10.3103/s8756699024700201

Elham Jasim Mohammad

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Abstract

Many studies about the multilayer coating have indicated the effects of reflection phase, reflection group delay (GD), and reflection group delay dispersion (GDD) characteristics. Some overlook the importance of studying complex statistical coefficients and their role in comparing the results of optical designs and realize how important information is in analyzing data. In statistics, one can learn various techniques for working with data. This paper goes into a detailed study of multilayer stacks’ dispersive properties for two mirror designs depending on MATLAB programs based on statistical parameters to evaluate the reflectance for the ZnS/MgF\({}_{2}\) mirror. Two samples with a quarter wavelength optical thickness were prepared, specially designed for 632.8 nm He-Ne laser mirrors. For the designed mirror, the value of the reflectivity of the thirteen-layer ZnS/MgF\({}_{2}\) mirror is 99.34\(\%\), while for the seven-layer ZnS/MgF\({}_{2}\) mirror is 96.57\(\%\). This study presents greater detail on statistics and realized data topics when designing multilayer coating, including mean, median, mode, and standard deviation (STD). The reliability and accuracy of the data can be verified by calculating the standard deviation.

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利用统计参数确定多层涂层的分散特性

摘要许多关于多层镀膜的研究都指出了反射相位、反射群延迟（GD）和反射群延迟色散（GDD）特性的影响。有些人忽视了研究复杂统计系数的重要性及其在比较光学设计结果中的作用，并没有意识到信息在分析数据中的重要性。在统计学中，人们可以学习到处理数据的各种技巧。本文根据基于统计参数的 MATLAB 程序，详细研究了两种镜面设计的多层叠层色散特性，以评估 ZnS/MgF\({}_{2}\) 镜面的反射率。我们制备了两个具有四分之一波长光学厚度的样品，专门用于 632.8 nm He-Ne 激光反射镜。对于所设计的反射镜，十三层ZnS/MgF\({}_{2}\) 反射镜的反射率为99.34（%），而七层ZnS/MgF\({}_{2}\) 反射镜的反射率为96.57（%）。本研究更详细地介绍了设计多层镀膜时的统计数据和已实现的数据主题，包括平均值、中位数、模式和标准偏差（STD）。数据的可靠性和准确性可以通过计算标准偏差来验证。

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来源期刊

Optoelectronics Instrumentation and Data Processing PHYSICS, MULTIDISCIPLINARY-

CiteScore

1.00

自引率

50.00%

发文量

期刊介绍： The scope of Optoelectronics, Instrumentation and Data Processing encompasses, but is not restricted to, the following areas: analysis and synthesis of signals and images; artificial intelligence methods; automated measurement systems; physicotechnical foundations of micro- and optoelectronics; optical information technologies; systems and components; modelling in physicotechnical research; laser physics applications; computer networks and data transmission systems. The journal publishes original papers, reviews, and short communications in order to provide the widest possible coverage of latest research and development in its chosen field.