{"title":"RIS Assisted AmBc Communication Over Spatially Correlated Channels","authors":"Anish Kumar Gupta;Punitkumar Bhavsar","doi":"10.1109/JRFID.2024.3394063","DOIUrl":null,"url":null,"abstract":"This article proposes incorporation of reconfigurable intelligent surfaces (RIS) with ambient backscatter (AmBc) communication. The aim is to strengthen the radio links between ambient source to backscatter device (BD) and from BD to cooperative receiver (CR). The analysis considers correlated Rician channels and incorporates hardware imperfection (HWI) modeled by von-Mises distribution. We derive a closed form expression of the outage probability which is validated through Monte Carlo (MC) simulations. The findings show improvement in outage probability for a deliberate selection of parameters of the proposed RIS assisted AmBc communication system. In addition, the importance of correlated-channel behavior is considered and analyzed for its effect on the outage probability performance of the proposed system.","PeriodicalId":73291,"journal":{"name":"IEEE journal of radio frequency identification","volume":null,"pages":null},"PeriodicalIF":2.3000,"publicationDate":"2024-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE journal of radio frequency identification","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10509593/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This article proposes incorporation of reconfigurable intelligent surfaces (RIS) with ambient backscatter (AmBc) communication. The aim is to strengthen the radio links between ambient source to backscatter device (BD) and from BD to cooperative receiver (CR). The analysis considers correlated Rician channels and incorporates hardware imperfection (HWI) modeled by von-Mises distribution. We derive a closed form expression of the outage probability which is validated through Monte Carlo (MC) simulations. The findings show improvement in outage probability for a deliberate selection of parameters of the proposed RIS assisted AmBc communication system. In addition, the importance of correlated-channel behavior is considered and analyzed for its effect on the outage probability performance of the proposed system.