Interaction between catechol-O-methyltransferase Val/Met polymorphism and cognitive reserve for negative symptoms in schizophrenia

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-05-19 DOI:10.5498/wjp.v14.i5.695
Wen-peng Hou, Xiang-Qin Qin, Wei-Wei Hou, Yun-Yi Han, Qi-Jing Bo, Fang Dong, F. Zhou, Xian-Bin Li, Chuan-Yue Wang
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Abstract

BACKGROUND Cognitive reserve (CR) and the catechol-O-methyltransferase (COMT ) Val/Met polymorphism are reportedly linked to negative symptoms in schizophrenia. However, the regulatory effect of the COMT genotype on the relationship between CR and negative symptoms is still unexamined. AIM To investigate whether the relationship between CR and negative symptoms could be regulated by the COMT Val/Met polymorphism. METHODS In a cross-sectional study, 54 clinically stable patients with schizophrenia underwent assessments for the COMT genotype, CR, and negative symptoms. CR was estimated using scores in the information and similarities subtests of a short form of the Chinese version of the Wechsler Adult Intelligence Scale. RESULTS COMT Met-carriers exhibited fewer negative symptoms than Val homozygotes. In the total sample, significant negative correlations were found between negative symptoms and information, similarities. Associations between information, similarities and negative symptoms were observed in Val homozygotes only, with information and similarities showing interaction effects with the COMT genotype in relation to negative symptoms (information, β = -0.282, 95%CI: -0.552 to -0.011, P = 0.042; similarities, β = -0.250, 95%CI: -0.495 to -0.004, P = 0.046). CONCLUSION This study provides initial evidence that the association between negative symptoms and CR is under the regulation of the COMT genotype in schizophrenia.
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儿茶酚-O-甲基转移酶 Val/Met 多态性与精神分裂症阴性症状认知储备之间的相互作用
背景 据报道,认知储备(CR)和儿茶酚-O-甲基转移酶(COMT)Val/Met 多态性与精神分裂症的阴性症状有关。然而,COMT 基因型对 CR 与阴性症状之间关系的调节作用仍未得到研究。目的 研究COMT Val/Met多态性是否能调节CR与阴性症状之间的关系。方法 在一项横断面研究中,54 名临床稳定的精神分裂症患者接受了 COMT 基因型、CR 和阴性症状的评估。CR是通过韦氏成人智力量表中文简表中的信息和相似性分测验的得分来估计的。结果 COMT Met 基因携带者比 Val 基因同源者表现出更少的消极症状。在所有样本中,阴性症状与信息、相似性之间存在明显的负相关。仅在 Val 基因同型携带者中观察到了信息、相似性与消极症状之间的关联,信息和相似性与 COMT 基因型在消极症状方面显示出交互效应(信息,β = -0.282,95%CI:-0.552 至 -0.011,P = 0.042;相似性,β = -0.250,95%CI:-0.495 至 -0.004,P = 0.046)。结论 本研究提供了初步证据,证明在精神分裂症患者中,阴性症状与 CR 之间的关联受 COMT 基因型的调节。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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