A Study on Unified Modelling Approach for Memristor: Next Generation Semiconductor Devices

Dr. K. Paramasivam, Ameer M, Bala Krishna R M, Kishore K
{"title":"A Study on Unified Modelling Approach for Memristor: Next Generation Semiconductor Devices","authors":"Dr. K. Paramasivam, Ameer M, Bala Krishna R M, Kishore K","doi":"10.59256/ijsreat.20240403005","DOIUrl":null,"url":null,"abstract":"This research investigates the voltage-current (V-I) characteristics of three distinct memristor models, each representing a unique composition and behaviour. The model, denoted as TiN-TiOx-HfOx-Pt-Bilayered Memristor model, is a compact representation designed for Metal–Oxide Resistive Random Access Memory (RRAM). Matlab tool is used for the simulation to analyse V-I characteristics of Memristor. Through comprehensive analysis and simulations, we aim to provide a detailed insight into the intrinsic behaviours of the memristor models. Understanding the V-I characteristics of these models is crucial for their potential applications in emerging memory technologies. This Study elaborate the mathematical modelling of memristor with the outcome untuned V-I Characteristics - DC Switching characteristics. The findings contribute to the broader field of memristor research, fostering advancements in electronic memory devices and computational systems","PeriodicalId":310227,"journal":{"name":"International Journal Of Scientific Research In Engineering & Technology","volume":"34 6","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal Of Scientific Research In Engineering & Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.59256/ijsreat.20240403005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This research investigates the voltage-current (V-I) characteristics of three distinct memristor models, each representing a unique composition and behaviour. The model, denoted as TiN-TiOx-HfOx-Pt-Bilayered Memristor model, is a compact representation designed for Metal–Oxide Resistive Random Access Memory (RRAM). Matlab tool is used for the simulation to analyse V-I characteristics of Memristor. Through comprehensive analysis and simulations, we aim to provide a detailed insight into the intrinsic behaviours of the memristor models. Understanding the V-I characteristics of these models is crucial for their potential applications in emerging memory technologies. This Study elaborate the mathematical modelling of memristor with the outcome untuned V-I Characteristics - DC Switching characteristics. The findings contribute to the broader field of memristor research, fostering advancements in electronic memory devices and computational systems
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
晶闸管统一建模方法研究:下一代半导体器件
这项研究调查了三种不同忆阻器模型的电压-电流(V-I)特性,每种模型都代表了独特的组成和行为。该模型被称为 TiN-TiOx-HfOx-Pt-Bilayered Memristor 模型,是为金属氧化物电阻式随机存取存储器(RRAM)设计的一种紧凑型表示方法。我们使用 Matlab 工具进行仿真,分析 Memristor 的 V-I 特性。通过综合分析和模拟,我们旨在详细了解忆阻器模型的内在行为。了解这些模型的 V-I 特性对于它们在新兴存储器技术中的潜在应用至关重要。本研究阐述了忆阻器的数学建模,其结果是未经调谐的 V-I 特性--直流开关特性。研究结果有助于更广泛的忆阻器研究领域,促进电子存储设备和计算系统的进步。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Study on low power ADC Design using Memristor on Embedded systems A Study on Unified Modelling Approach for Memristor: Next Generation Semiconductor Devices Design and Analysis of the Exhaust Muffler for Two-Wheeler Vehicle Intelligent Space: Enhancing Living Environment with Smart Technology (Smart Room) Smart Waste Management System Using IoT
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1