Guo-Yao Li, Pin‐Qiang Mo, He Yang, Hai-Sui Yu, Yong-Jun Qin
{"title":"Undrained cavity expansion-contraction analysis in CASM and its application for pressuremeter tests","authors":"Guo-Yao Li, Pin‐Qiang Mo, He Yang, Hai-Sui Yu, Yong-Jun Qin","doi":"10.1139/cgj-2024-0011","DOIUrl":null,"url":null,"abstract":"Many geotechnical scenarios involve cavity unloading from a loaded state, particularly in pressuremeter tests, and the unloading data of pressuremeter tests has exceptional attraction as it is less disturbed by the insertion process. However, the analyses for continuous cavity loading and unloading (i.e., cavity initially experiences expansion and then contracts) in critical state soils are rarely studied. To this end, a novel semi-analytical solution based on the unified state parameter model for clay and sand (CASM) is proposed for the whole expansion-contraction of spherical and cylindrical cavities under undrained condition. The problem assumes that the cavity is unloaded after a monotonic loading stage, leading to plastic regions during both loading and unloading periods. The cavity response for the whole expansion-contraction process is investigated, with the total pressure and stress paths at the cavity wall presented and validated against numerical simulation. The developed solution is successfully implemented to interpret both loading and unloading data of pressuremeter tests. The undrained shear strength, in-situ effective horizontal stress and initial overconsolidation ratio are back analyzed by using a curve fitting method based on the proposed solution.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"122 8","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"89","ListUrlMain":"https://doi.org/10.1139/cgj-2024-0011","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Many geotechnical scenarios involve cavity unloading from a loaded state, particularly in pressuremeter tests, and the unloading data of pressuremeter tests has exceptional attraction as it is less disturbed by the insertion process. However, the analyses for continuous cavity loading and unloading (i.e., cavity initially experiences expansion and then contracts) in critical state soils are rarely studied. To this end, a novel semi-analytical solution based on the unified state parameter model for clay and sand (CASM) is proposed for the whole expansion-contraction of spherical and cylindrical cavities under undrained condition. The problem assumes that the cavity is unloaded after a monotonic loading stage, leading to plastic regions during both loading and unloading periods. The cavity response for the whole expansion-contraction process is investigated, with the total pressure and stress paths at the cavity wall presented and validated against numerical simulation. The developed solution is successfully implemented to interpret both loading and unloading data of pressuremeter tests. The undrained shear strength, in-situ effective horizontal stress and initial overconsolidation ratio are back analyzed by using a curve fitting method based on the proposed solution.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico