Uncertainties of Nuclear Level Density estimated by Bayesian Neural Networks

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-05-06 DOI:10.1088/1674-1137/ad47a7
Xinyu Wang, Ying Cui, Yuan Tian, Kai Zhao, Ying-Xun Zhang
{"title":"Uncertainties of Nuclear Level Density estimated by Bayesian Neural Networks","authors":"Xinyu Wang, Ying Cui, Yuan Tian, Kai Zhao, Ying-Xun Zhang","doi":"10.1088/1674-1137/ad47a7","DOIUrl":null,"url":null,"abstract":"\n Nuclear level density (NLD) is a critical parameter for understanding nuclear reactions and the structure of atomic nuclei, yet accurate estimation of NLD is challenging due to limitations inherent in both experimental measurements and theoretical models. This paper presents a sophisticated approach using Bayesian Neural Networks (BNN) to analyse NLD across a wide range of models. It uniquely incorporates the assessment of model uncertainties. The application of BNN has demonstrated remarkable success in accurately predicting NLD values when compared to recent experimental data, confirming the effectiveness of our methodology. The reliability and predictive power of the BNN approach not only validates its current application, but also encourages its integration into future analyses of nuclear reaction cross sections.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"8 3","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1088/1674-1137/ad47a7","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract

Nuclear level density (NLD) is a critical parameter for understanding nuclear reactions and the structure of atomic nuclei, yet accurate estimation of NLD is challenging due to limitations inherent in both experimental measurements and theoretical models. This paper presents a sophisticated approach using Bayesian Neural Networks (BNN) to analyse NLD across a wide range of models. It uniquely incorporates the assessment of model uncertainties. The application of BNN has demonstrated remarkable success in accurately predicting NLD values when compared to recent experimental data, confirming the effectiveness of our methodology. The reliability and predictive power of the BNN approach not only validates its current application, but also encourages its integration into future analyses of nuclear reaction cross sections.
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贝叶斯神经网络估算的核电平密度的不确定性
核电平密度(NLD)是了解核反应和原子核结构的关键参数,但由于实验测量和理论模型的固有局限性,准确估算 NLD 具有挑战性。本文介绍了一种利用贝叶斯神经网络(BNN)分析各种模型中 NLD 的复杂方法。它独特地纳入了对模型不确定性的评估。与最近的实验数据相比,贝叶斯神经网络的应用在准确预测 NLD 值方面取得了显著成功,证实了我们方法的有效性。BNN 方法的可靠性和预测能力不仅验证了其当前的应用,而且鼓励将其纳入未来的核反应截面分析中。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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