Xinyu Wang, Ying Cui, Yuan Tian, Kai Zhao, Ying-Xun Zhang
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引用次数: 0
Abstract
Nuclear level density (NLD) is a critical parameter for understanding nuclear reactions and the structure of atomic nuclei, yet accurate estimation of NLD is challenging due to limitations inherent in both experimental measurements and theoretical models. This paper presents a sophisticated approach using Bayesian Neural Networks (BNN) to analyse NLD across a wide range of models. It uniquely incorporates the assessment of model uncertainties. The application of BNN has demonstrated remarkable success in accurately predicting NLD values when compared to recent experimental data, confirming the effectiveness of our methodology. The reliability and predictive power of the BNN approach not only validates its current application, but also encourages its integration into future analyses of nuclear reaction cross sections.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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