{"title":"Adversarial Attacks and Defenses in Fault Detection and Diagnosis: A Comprehensive Benchmark on the Tennessee Eastman Process","authors":"Vitaliy Pozdnyakov;Aleksandr Kovalenko;Ilya Makarov;Mikhail Drobyshevskiy;Kirill Lukyanov","doi":"10.1109/OJIES.2024.3401396","DOIUrl":null,"url":null,"abstract":"Integrating machine learning into Automated Control Systems (ACS) enhances decision-making in industrial process management. One of the limitations to the widespread adoption of these technologies in industry is the vulnerability of neural networks to adversarial attacks. This study explores the threats in deploying deep learning models for Fault Detection and Diagnosis (FDD) in ACS using the Tennessee Eastman Process dataset. By evaluating three neural networks with different architectures, we subject them to six types of adversarial attacks and explore five different defense methods. Our results highlight the strong vulnerability of models to adversarial samples and the varying effectiveness of defense strategies. We also propose a new defense strategy based on combining adversarial training and data quantization. This research contributes several insights into securing machine learning within ACS, ensuring robust FDD in industrial processes.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"428-440"},"PeriodicalIF":5.2000,"publicationDate":"2024-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10531068","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Open Journal of the Industrial Electronics Society","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10531068/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Integrating machine learning into Automated Control Systems (ACS) enhances decision-making in industrial process management. One of the limitations to the widespread adoption of these technologies in industry is the vulnerability of neural networks to adversarial attacks. This study explores the threats in deploying deep learning models for Fault Detection and Diagnosis (FDD) in ACS using the Tennessee Eastman Process dataset. By evaluating three neural networks with different architectures, we subject them to six types of adversarial attacks and explore five different defense methods. Our results highlight the strong vulnerability of models to adversarial samples and the varying effectiveness of defense strategies. We also propose a new defense strategy based on combining adversarial training and data quantization. This research contributes several insights into securing machine learning within ACS, ensuring robust FDD in industrial processes.
期刊介绍:
The IEEE Open Journal of the Industrial Electronics Society is dedicated to advancing information-intensive, knowledge-based automation, and digitalization, aiming to enhance various industrial and infrastructural ecosystems including energy, mobility, health, and home/building infrastructure. Encompassing a range of techniques leveraging data and information acquisition, analysis, manipulation, and distribution, the journal strives to achieve greater flexibility, efficiency, effectiveness, reliability, and security within digitalized and networked environments.
Our scope provides a platform for discourse and dissemination of the latest developments in numerous research and innovation areas. These include electrical components and systems, smart grids, industrial cyber-physical systems, motion control, robotics and mechatronics, sensors and actuators, factory and building communication and automation, industrial digitalization, flexible and reconfigurable manufacturing, assistant systems, industrial applications of artificial intelligence and data science, as well as the implementation of machine learning, artificial neural networks, and fuzzy logic. Additionally, we explore human factors in digitalized and networked ecosystems. Join us in exploring and shaping the future of industrial electronics and digitalization.