{"title":"Code Multiview Hypergraph Representation Learning for Software Defect Prediction","authors":"Shaojian Qiu;Mengyang Huang;Yun Liang;Chaoda Peng;Yuan Yuan","doi":"10.1109/TR.2024.3393415","DOIUrl":null,"url":null,"abstract":"Software defect prediction technology aids the reliability assurance team in identifying defect-prone code and assists the team in reasonably allocating limited testing resources. Recently, researchers assumed that the topological associations among code fragments could be harnessed to construct defect prediction models. Nevertheless, existing graph-based methods only concentrate on features of single-view association, which fail to fully capture the rich information hidden in the code. In addition, software defects may involve multiple code fragments simultaneously, but traditional binary graph structures are insufficient for representing these multivariate associations. To address these two challenges, this article proposes a multiview hypergraph representation learning approach (MVHR-DP) to amplify the potency of code features in defect prediction. MVHR-DP initiates by creating hypergraph structures for each code view, which are then amalgamated into a comprehensive fusion hypergraph. Following this, a hypergraph neural network is established to extract code features from multiple views and intricate associations, thereby enhancing the comprehensiveness of representation in the modeling data. Empirical study shows that the prediction model utilizing features generated by MVHR-DP exhibits superior area under the curve (AUC), F-measure, and matthews correlation coefficient (MCC) results compared to baseline approaches across within-project, cross-version, and cross-project prediction tasks.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"73 4","pages":"1863-1876"},"PeriodicalIF":5.0000,"publicationDate":"2024-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10531109/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Software defect prediction technology aids the reliability assurance team in identifying defect-prone code and assists the team in reasonably allocating limited testing resources. Recently, researchers assumed that the topological associations among code fragments could be harnessed to construct defect prediction models. Nevertheless, existing graph-based methods only concentrate on features of single-view association, which fail to fully capture the rich information hidden in the code. In addition, software defects may involve multiple code fragments simultaneously, but traditional binary graph structures are insufficient for representing these multivariate associations. To address these two challenges, this article proposes a multiview hypergraph representation learning approach (MVHR-DP) to amplify the potency of code features in defect prediction. MVHR-DP initiates by creating hypergraph structures for each code view, which are then amalgamated into a comprehensive fusion hypergraph. Following this, a hypergraph neural network is established to extract code features from multiple views and intricate associations, thereby enhancing the comprehensiveness of representation in the modeling data. Empirical study shows that the prediction model utilizing features generated by MVHR-DP exhibits superior area under the curve (AUC), F-measure, and matthews correlation coefficient (MCC) results compared to baseline approaches across within-project, cross-version, and cross-project prediction tasks.
期刊介绍:
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.