This article presents a distinctive and reliable fault location approach tailored for three-ended transmission lines using voltage and current phasors acquired from intelligent electronic devices (IEDs) based digital relays installed individually at each end, without data synchronization functions. By integrating analytic methodologies with state-of-the-art synchronization algorithms and an imaginary-part observation method, an exclusive faulty branch index and a fault location index are designed to pinpoint closed-form faulty line branch and fault position solutions. Crucially, the unsynchronized phasor measurements among three ends can be simultaneously eliminated from the proposed noniterative calculation process. Not only is the proposed method unaffected by synchronization-angle estimation mismatch, but it also avoids problems such as multiple or approximate solutions, fault-path and source impedance assumptions, numerical divergence, and fault-type selections. The proposed method has been deployed in the fault location platform of Taiwan Power Company (Taipower) since early 2024. Importantly, both simulations and field empirical testing conducted on Taipower's actual fault events have validated the feasibility and effectiveness of the suggested ideas in power industry applications, showcasing its potential impact to enhance fault location accuracy and reliability in real-world operational environments.
{"title":"An Analytic Fault-Location Expression for Three-Ended Transmission Networks Capable of Avoiding Synchronization-Angle Estimation Mismatch","authors":"Tzu-Chiao Lin;Zhi-Ren Xu;Bawoke Simachew","doi":"10.1109/TR.2025.3626027","DOIUrl":"https://doi.org/10.1109/TR.2025.3626027","url":null,"abstract":"This article presents a distinctive and reliable fault location approach tailored for three-ended transmission lines using voltage and current phasors acquired from intelligent electronic devices (IEDs) based digital relays installed individually at each end, without data synchronization functions. By integrating analytic methodologies with state-of-the-art synchronization algorithms and an imaginary-part observation method, an exclusive faulty branch index and a fault location index are designed to pinpoint closed-form faulty line branch and fault position solutions. Crucially, the unsynchronized phasor measurements among three ends can be simultaneously eliminated from the proposed noniterative calculation process. Not only is the proposed method unaffected by synchronization-angle estimation mismatch, but it also avoids problems such as multiple or approximate solutions, fault-path and source impedance assumptions, numerical divergence, and fault-type selections. The proposed method has been deployed in the fault location platform of Taiwan Power Company (Taipower) since early 2024. Importantly, both simulations and field empirical testing conducted on Taipower's actual fault events have validated the feasibility and effectiveness of the suggested ideas in power industry applications, showcasing its potential impact to enhance fault location accuracy and reliability in real-world operational environments.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"75 ","pages":"723-737"},"PeriodicalIF":5.7,"publicationDate":"2026-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146082239","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Tran Manh Hoang;Ba Cao Nguyen;Nguyen Tan Danh;Nguyen Van Minh;Le The Dung
In this article, mathematical studies utilizing finite block length in a full-duplex (FD) relay network with multiple antennas and nonorthogonal multiple access (NOMA). Specifically, the block error rate (BLER) and age-of-information (AoI) of the investigated system with residual self-interference and imperfect successive interference cancellation are derived. Moreover, the power allocation coefficient is optimized to minimize the average BLER and the influences of various parameters on system's performance are examined. We enhance the BLER and AoI performance by employing the maximal-ratio combining and maximal-ratio transmission techniques at multiple antennas of source and destination nodes. Simulation results validate our analytical frameworks. Numerical results indicate that employing multiantennas for a NOMA system with FD relay gives exceptionally low average BLER that fulfils the targets of high reliability and latency of the wireless systems. Furthermore, the optimal AoI of the investigated system can be achieved by selecting a suitable block length. In particular, the minimum AoI is obtained when SNR = 10 dB and the block length is 300. Also, the average BLER and average AoI of the considered NOMA-FD system outperform conventional orthogonal multiple access and half-duplex (HD) systems. Especially when the block length is less than 250, the AoI of the FD system is reduced by 90% compared to that of the HD system.
{"title":"BLER and AoI Analysis of Multiantenna NOMA-FD Relay Systems for Short-Packet Communications","authors":"Tran Manh Hoang;Ba Cao Nguyen;Nguyen Tan Danh;Nguyen Van Minh;Le The Dung","doi":"10.1109/TR.2026.3653652","DOIUrl":"https://doi.org/10.1109/TR.2026.3653652","url":null,"abstract":"In this article, mathematical studies utilizing finite block length in a full-duplex (FD) relay network with multiple antennas and nonorthogonal multiple access (NOMA). Specifically, the block error rate (BLER) and age-of-information (AoI) of the investigated system with residual self-interference and imperfect successive interference cancellation are derived. Moreover, the power allocation coefficient is optimized to minimize the average BLER and the influences of various parameters on system's performance are examined. We enhance the BLER and AoI performance by employing the maximal-ratio combining and maximal-ratio transmission techniques at multiple antennas of source and destination nodes. Simulation results validate our analytical frameworks. Numerical results indicate that employing multiantennas for a NOMA system with FD relay gives exceptionally low average BLER that fulfils the targets of high reliability and latency of the wireless systems. Furthermore, the optimal AoI of the investigated system can be achieved by selecting a suitable block length. In particular, the minimum AoI is obtained when SNR = 10 dB and the block length is 300. Also, the average BLER and average AoI of the considered NOMA-FD system outperform conventional orthogonal multiple access and half-duplex (HD) systems. Especially when the block length is less than 250, the AoI of the FD system is reduced by 90% compared to that of the HD system.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"75 ","pages":"738-751"},"PeriodicalIF":5.7,"publicationDate":"2026-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146082242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"2025 Index IEEE Transactions on Reliability Vol. 74","authors":"","doi":"10.1109/TR.2025.3646839","DOIUrl":"https://doi.org/10.1109/TR.2025.3646839","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 4","pages":"1-66"},"PeriodicalIF":5.7,"publicationDate":"2026-01-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11353211","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145982161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The failure mode and effect analysis (FMEA) method as an effective reliability management tool has gained broad applications in the realm of product, system, and service. Currently, it is widespread to bring the trust relationship (TR) in risk assessment, which enhances the FMEA quality and has challenging problems, such as the construction of indirect relationships, the expert's weight determination, and the risk assessment interaction in the trust network. According to these points, we propose an improved FMEA method, where an indirect TR construction mechanism, a hybrid expert's weight determining method, and a risk assessment evolution model under the trust network are designed. The proposed FMEA method better integrates the TR with the FMEA. In addition, to fit experts’ different expression habits, different information forms are used in this study to enhance the flexibility of risk assessment. To substantiate the superiority and rationality of the proposed method in this study, a case study and further discussion are presented.
{"title":"An Improved Failure Mode and Effect Analysis Method Based on Trust Relationship Exploration","authors":"Peide Liu;Yifan Wu;Ying Li;Peng Wang","doi":"10.1109/TR.2025.3609550","DOIUrl":"https://doi.org/10.1109/TR.2025.3609550","url":null,"abstract":"The failure mode and effect analysis (FMEA) method as an effective reliability management tool has gained broad applications in the realm of product, system, and service. Currently, it is widespread to bring the trust relationship (TR) in risk assessment, which enhances the FMEA quality and has challenging problems, such as the construction of indirect relationships, the expert's weight determination, and the risk assessment interaction in the trust network. According to these points, we propose an improved FMEA method, where an indirect TR construction mechanism, a hybrid expert's weight determining method, and a risk assessment evolution model under the trust network are designed. The proposed FMEA method better integrates the TR with the FMEA. In addition, to fit experts’ different expression habits, different information forms are used in this study to enhance the flexibility of risk assessment. To substantiate the superiority and rationality of the proposed method in this study, a case study and further discussion are presented.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"75 ","pages":"752-764"},"PeriodicalIF":5.7,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146082243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Chenhui Cui;Yinming Huang;Rubing Huang;Ling Zhou;Rongcun Wang;Tao Li
Mobile graphical user interface (GUI) testing is a critical component of quality assurance for mobile applications. As GUI designs grow increasingly complex, vision-based testing methods have become essential for improving the quality of test scripts and reports. However, current approaches face significant limitations. For instance, the process of cropping GUI widgets requires significant manual effort and consumes considerable time. Meanwhile, existing automated testing tools still fail to generate satisfactory test sequences. In this article, we propose vision-based test sequence generation (VTSG), a novel perception-driven approach for mobile GUI testing. More specifically: first, VTSG employs a light-weight GUI element detection model to crop widgets from GUI pages automatically; second, guided by human perception principles, it sequences widget screenshots through saturation and spatial layout analysis; third, the system then integrates GUI widget interaction instructions to generate vision-based test scripts that accurately simulate human interaction patterns on mobile devices. We evaluate VTSG against four state-of-the-art GUI testing tools across five applications. Experimental results demonstrate that VTSG significantly outperforms existing methods, achieving 47.44% code coverage and 51.33% activity coverage, respectively, compared to the other approaches. In addition, we conduct a series of supplementary experiments on two mainstream commercial applications (i.e., Toutiao and Douyin). The results further confirm that VTSG maintains higher activity coverage even on these real-world commercial apps.
{"title":"A Novel Vision-Based Approach to Test Sequence Generation for Mobile GUI Testing","authors":"Chenhui Cui;Yinming Huang;Rubing Huang;Ling Zhou;Rongcun Wang;Tao Li","doi":"10.1109/TR.2025.3648728","DOIUrl":"https://doi.org/10.1109/TR.2025.3648728","url":null,"abstract":"Mobile <italic>graphical user interface</i> (GUI) testing is a critical component of quality assurance for mobile applications. As GUI designs grow increasingly complex, vision-based testing methods have become essential for improving the quality of test scripts and reports. However, current approaches face significant limitations. For instance, the process of cropping GUI widgets requires significant manual effort and consumes considerable time. Meanwhile, existing automated testing tools still fail to generate satisfactory test sequences. In this article, we propose <italic>vision-based test sequence generation</i> (VTSG), a novel perception-driven approach for mobile GUI testing. More specifically: first, VTSG employs a light-weight GUI element detection model to crop widgets from GUI pages automatically; second, guided by human perception principles, it sequences widget screenshots through saturation and spatial layout analysis; third, the system then integrates GUI widget interaction instructions to generate vision-based test scripts that accurately simulate human interaction patterns on mobile devices. We evaluate VTSG against four state-of-the-art GUI testing tools across five applications. Experimental results demonstrate that VTSG significantly outperforms existing methods, achieving 47.44% code coverage and 51.33% activity coverage, respectively, compared to the other approaches. In addition, we conduct a series of supplementary experiments on two mainstream commercial applications (i.e., <italic>Toutiao</i> and <italic>Douyin</i>). The results further confirm that VTSG maintains higher activity coverage even on these real-world commercial apps.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"75 ","pages":"664-678"},"PeriodicalIF":5.7,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145982346","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Knowledge graph completion (KGC) aims to infer missing triples for a given knowledge graph, which can be adopted to various fields ranging from scientific research to real-world applications. Despite the success of numerous KGC methods, the lack of explainability remains a common drawback. However, the explanation of KGC results is crucial in many cases, such as providing medical diagnosis and recommending candidates for costly experiments, which could increase the reliability of these techniques to humans. Although a few explainable KGC methods have been proposed, the explainability module is designed for the specific KGC model and cannot be utilized for state-of-the-art KGC models. In this work, we present a post-hoc generic method, namely KGC-Explainer, that can be applied to any KGC model providing triplet scores. KGC-Explainer not only incorporates the input KGC model itself, but also leverages the structural and textual information in knowledge graphs. To demonstrate KGC-Explainer achieving design goals and the superiority of it over other methods, we conduct extensive experiments on two real-world knowledge graphs with different domains and languages, one coming from medical domain in Chinese and another coming from general domain in English. In addition, we compare the KGC explanation with human explanation, showcasing the practical significance of KGC-Explainer.
{"title":"KGC-Explainer: Toward Explainable Knowledge Graph Completion","authors":"Chengbin Hou;Yufan Song;Jiarui Song;William Cheng-Chung Chu;Xiaolu Fei;Jia Li;Hairong Lv","doi":"10.1109/TR.2025.3650538","DOIUrl":"https://doi.org/10.1109/TR.2025.3650538","url":null,"abstract":"Knowledge graph completion (KGC) aims to infer missing triples for a given knowledge graph, which can be adopted to various fields ranging from scientific research to real-world applications. Despite the success of numerous KGC methods, the lack of explainability remains a common drawback. However, the explanation of KGC results is crucial in many cases, such as providing medical diagnosis and recommending candidates for costly experiments, which could increase the reliability of these techniques to humans. Although a few explainable KGC methods have been proposed, the explainability module is designed for the specific KGC model and cannot be utilized for state-of-the-art KGC models. In this work, we present a post-hoc generic method, namely KGC-Explainer, that can be applied to any KGC model providing triplet scores. KGC-Explainer not only incorporates the input KGC model itself, but also leverages the structural and textual information in knowledge graphs. To demonstrate KGC-Explainer achieving design goals and the superiority of it over other methods, we conduct extensive experiments on two real-world knowledge graphs with different domains and languages, one coming from medical domain in Chinese and another coming from general domain in English. In addition, we compare the KGC explanation with human explanation, showcasing the practical significance of KGC-Explainer.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"75 ","pages":"709-722"},"PeriodicalIF":5.7,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146026573","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Patch robustness certification is an emerging kind of provable defense technique against adversarial patch attacks for deep learning systems. Certified detection ensures the detection of all patched harmful versions of certified samples, which mitigates the failures of empirical defense techniques that could (easily) be compromised. However, existing certified detection methods are ineffective in certifying samples that are misclassified or whose mutants are inconsistently predicted to different labels. This article proposes HiCert, a novel masking-based certified detection technique. By focusing on the problem of mutants predicted with a label different from the true label with our formal analysis, HiCert formulates a novel formal relation between harmful samples generated by identified loopholes and their benign counterparts. By checking the bound of the maximum confidence among these potentially harmful (i.e., inconsistent) mutants of each benign sample, HiCert ensures that each harmful sample either has the minimum confidence among mutants that are predicted the same as the harmful sample itself below this bound, or has at least one mutant predicted with a label different from the harmful sample itself, formulated after two novel insights. As such, HiCert systematically certifies those inconsistent samples and consistent samples to a large extent. To our knowledge, HiCert is the first work capable of providing such a comprehensive patch robustness certification for certified detection. Our experiments show the high effectiveness of HiCert with a new state-of-the-art performance: It certifies significantly more benign samples, including those inconsistent and consistent, and achieves significantly higher accuracy on those samples without warnings and a significantly lower false silent ratio. Moreover, on actual patch attacks, its defense success ratio is significantly higher than its peers.
{"title":"HiCert: Toward Patch Robustness Certification and Detection for Deep Learning Systems Beyond Consistent Samples","authors":"Qilin Zhou;Zhengyuan Wei;Haipeng Wang;Zhuo Wang;Wing-Kwong Chan","doi":"10.1109/TR.2025.3642046","DOIUrl":"https://doi.org/10.1109/TR.2025.3642046","url":null,"abstract":"Patch robustness certification is an emerging kind of provable defense technique against adversarial patch attacks for deep learning systems. Certified detection ensures the detection of all patched harmful versions of certified samples, which mitigates the failures of empirical defense techniques that could (easily) be compromised. However, existing certified detection methods are ineffective in certifying samples that are misclassified or whose mutants are inconsistently predicted to different labels. This article proposes HiCert, a novel masking-based certified detection technique. By focusing on the problem of mutants predicted with a label different from the true label with our formal analysis, HiCert formulates a novel formal relation between harmful samples generated by identified loopholes and their benign counterparts. By checking the bound of the maximum confidence among these potentially harmful (i.e., inconsistent) mutants of each benign sample, HiCert ensures that each harmful sample either has the minimum confidence among mutants that are predicted the same as the harmful sample itself below this bound, or has at least one mutant predicted with a label different from the harmful sample itself, formulated after two novel insights. As such, HiCert systematically certifies those inconsistent samples and consistent samples to a large extent. To our knowledge, HiCert is the <italic>first</i> work capable of providing such a comprehensive patch robustness certification for certified detection. Our experiments show the high effectiveness of HiCert with a new state-of-the-art performance: It certifies significantly more benign samples, including those inconsistent and consistent, and achieves significantly higher accuracy on those samples without warnings and a significantly lower false silent ratio. Moreover, on actual patch attacks, its defense success ratio is significantly higher than its peers.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"75 ","pages":"679-693"},"PeriodicalIF":5.7,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146026615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Board-levelhardware Trojan (HT) is a malicious modification in the printed circuit board (PCB). It may lead the victim device to denial of service or leak confidential information. To tackle this issue, we propose an HT detection method which can detect and locate Trojan across layers. First, we obtain the thermal conductivity and temperature feature maps for a group of unauthentic PCBs. For each pixel in the maps, we construct a matrix which contains the above two feature pairs for all boards. Then, we apply the density peak clustering algorithm to distinguish Trojan-infected boards from Trojan-free ones in the feature space. Finally, we analyze the clustering result on each pixel and locate the Trojan position on the infected PCBs. The experimental results reveal that our method is effective. Generally, for the well-recognized PCBench and TRIT-PCB benchmarks, the Trojan detection accuracy is higher than 96.3% and the location error is less than 2.2%, even though the Trojan is as small as 3.5 mm$^{2}$. In addition, we demonstrate the advantages of our approach over two existing HT detection methods, namely, automated visual inspection and differential power monitoring. We also make a thorough discussion on how the PCB manufacturing process variation, feature map resolution, and Trojan area affect the detection results.
{"title":"Hardware Trojan Detection on PCBs Using Density Peak Clustering","authors":"Yang Zhang;Jian Wang;Zhe Chen;Zhaorui Yang","doi":"10.1109/TR.2025.3645817","DOIUrl":"https://doi.org/10.1109/TR.2025.3645817","url":null,"abstract":"Board-levelhardware Trojan (HT) is a malicious modification in the printed circuit board (PCB). It may lead the victim device to denial of service or leak confidential information. To tackle this issue, we propose an HT detection method which can detect and locate Trojan across layers. First, we obtain the thermal conductivity and temperature feature maps for a group of unauthentic PCBs. For each pixel in the maps, we construct a matrix which contains the above two feature pairs for all boards. Then, we apply the density peak clustering algorithm to distinguish Trojan-infected boards from Trojan-free ones in the feature space. Finally, we analyze the clustering result on each pixel and locate the Trojan position on the infected PCBs. The experimental results reveal that our method is effective. Generally, for the well-recognized PCBench and TRIT-PCB benchmarks, the Trojan detection accuracy is higher than 96.3% and the location error is less than 2.2%, even though the Trojan is as small as 3.5 mm<inline-formula><tex-math>$^{2}$</tex-math></inline-formula>. In addition, we demonstrate the advantages of our approach over two existing HT detection methods, namely, automated visual inspection and differential power monitoring. We also make a thorough discussion on how the PCB manufacturing process variation, feature map resolution, and Trojan area affect the detection results.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"75 ","pages":"518-528"},"PeriodicalIF":5.7,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145982180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Fault diagnosis is essential for maintaining the regular operation of multiprocessor systems. In this article, we introduce a novel concept of $r$-component $H$-structure diagnosability, denoted as $t_{s}^{r}(G;H)$, which represents the maximum number of $r$-component $H$-structure faults that system $G$ can precisely detect. This parameter enables us to assess the overall diagnosability of the system. Furthermore, we strictly prove that under the PMC and MM* diagnostic models, the following results hold: for $ngeq 7$, $t_{s}^{2}(Q_{n};K_{1,1})=2n-4$; for $ngeq 6$, $t_{s}^{2}(Q_{n};K_{1,2})=n-2$. These results confirm that when the system experiences a $K_{1,1}$-structural fault and is disconnected at this time, the maximum number of detectable $K_{1,1}$-structures within the system is guaranteed to be twice the original number in previous studies.
{"title":"A Novel Diagnostic Measurement of Structural Faults in Multiprocessor Systems: Based on Component Quantity Analysis","authors":"Nengjin Zhuo;Shumin Zhang;Jou-Ming Chang;Bo Zhu","doi":"10.1109/TR.2025.3648586","DOIUrl":"https://doi.org/10.1109/TR.2025.3648586","url":null,"abstract":"Fault diagnosis is essential for maintaining the regular operation of multiprocessor systems. In this article, we introduce a novel concept of <inline-formula><tex-math>$r$</tex-math></inline-formula>-component <inline-formula><tex-math>$H$</tex-math></inline-formula>-structure diagnosability, denoted as <inline-formula><tex-math>$t_{s}^{r}(G;H)$</tex-math></inline-formula>, which represents the maximum number of <inline-formula><tex-math>$r$</tex-math></inline-formula>-component <inline-formula><tex-math>$H$</tex-math></inline-formula>-structure faults that system <inline-formula><tex-math>$G$</tex-math></inline-formula> can precisely detect. This parameter enables us to assess the overall diagnosability of the system. Furthermore, we strictly prove that under the PMC and MM* diagnostic models, the following results hold: for <inline-formula><tex-math>$ngeq 7$</tex-math></inline-formula>, <inline-formula><tex-math>$t_{s}^{2}(Q_{n};K_{1,1})=2n-4$</tex-math></inline-formula>; for <inline-formula><tex-math>$ngeq 6$</tex-math></inline-formula>, <inline-formula><tex-math>$t_{s}^{2}(Q_{n};K_{1,2})=n-2$</tex-math></inline-formula>. These results confirm that when the system experiences a <inline-formula><tex-math>$K_{1,1}$</tex-math></inline-formula>-structural fault and is disconnected at this time, the maximum number of detectable <inline-formula><tex-math>$K_{1,1}$</tex-math></inline-formula>-structures within the system is guaranteed to be twice the original number in previous studies.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"75 ","pages":"612-623"},"PeriodicalIF":5.7,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145982126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Single-sided aluminized polyimide films (SAPF) are widely used in thermal management of aerospace systems. Although the reliability of SAPF in space environments has been thoroughly studied, its reliability in ground environments during storage is always ignored, potentially leading to system failure. This article aims to investigate the reliability of SAPF in storage environments, focusing on the effects of temperature and relative humidity. First, the relationship between the performance degradation of SAPF and aluminum corrosion is identified. Next, considering the presence of two distinct stages in the influence of temperature on aluminum corrosion, a novel degradation model accounting for the degradation mechanism transition is developed. Additionally, a parameter analysis method is proposed for determining SAPF degradation mechanism based on experimental data. Then, a statistical analysis method incorporating an improved rime optimization algorithm is employed for parameter estimation, and the reliability model is established. Experimental results demonstrate that the proposed method effectively identifies two distinct stages in the impact of temperature on SAPF performance degradation. Furthermore, the proposed degradation model outperforms traditional degradation models with unchanged degradation mechanism in terms of degradation prediction accuracy, extrapolation capability, and robustness, indicating its suitability for describing the degradation pattern of SAPFs.
{"title":"Reliability Modeling of Single-Sided Aluminized Polyimide Films During Storage Considering Stress-Induced Degradation Mechanism Transition","authors":"Shi-Shun Chen;Dong-Hua Niu;Wen-Bin Chen;Jia-Yun Song;Ya-Fei Zhang;Xiao-Yang Li;Enrico Zio","doi":"10.1109/TR.2025.3648418","DOIUrl":"https://doi.org/10.1109/TR.2025.3648418","url":null,"abstract":"Single-sided aluminized polyimide films (SAPF) are widely used in thermal management of aerospace systems. Although the reliability of SAPF in space environments has been thoroughly studied, its reliability in ground environments during storage is always ignored, potentially leading to system failure. This article aims to investigate the reliability of SAPF in storage environments, focusing on the effects of temperature and relative humidity. First, the relationship between the performance degradation of SAPF and aluminum corrosion is identified. Next, considering the presence of two distinct stages in the influence of temperature on aluminum corrosion, a novel degradation model accounting for the degradation mechanism transition is developed. Additionally, a parameter analysis method is proposed for determining SAPF degradation mechanism based on experimental data. Then, a statistical analysis method incorporating an improved rime optimization algorithm is employed for parameter estimation, and the reliability model is established. Experimental results demonstrate that the proposed method effectively identifies two distinct stages in the impact of temperature on SAPF performance degradation. Furthermore, the proposed degradation model outperforms traditional degradation models with unchanged degradation mechanism in terms of degradation prediction accuracy, extrapolation capability, and robustness, indicating its suitability for describing the degradation pattern of SAPFs.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"75 ","pages":"596-611"},"PeriodicalIF":5.7,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145982334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：