Milling Stability Modeling by Sample Partitioning with Chatter Frequency-Based Test Point Selection

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-05-24 DOI:10.3390/jmmp8030109
Tony Schmitz
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Abstract

This paper describes a sample partitioning approach to retain or reject samples from an initial distribution of stability maps using milling test results. The stability maps are calculated using distributions of uncertain modal parameters that represent the tool tip frequency response functions and cutting force model coefficients. Test points for sample partitioning are selected using either (1) the combination of spindle speed and mean axial depth from the available samples that provides the high material removal rate, or (2) a spindle speed based on the chatter frequency and mean axial depth at that spindle speed. The latter is selected when an unstable (chatter) result is obtained from a test. Because the stability model input parameters are also partitioned using the test results, their uncertainty is reduced using a limited number of tests and the milling stability model accuracy is increased. A case study is provided to evaluate the algorithm.
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通过样品分区和基于颤振频率的测试点选择建立铣削稳定性模型
本文介绍了一种样本划分方法,利用铣削测试结果从稳定性图的初始分布中保留或剔除样本。稳定图是利用代表刀尖频率响应函数和切削力模型系数的不确定模态参数分布计算得出的。样本分区的测试点是通过以下两种方式选择的:(1) 从现有样本中选择主轴转速和平均轴向深度的组合,以提供较高的材料去除率;或 (2) 根据颤振频率和该主轴转速下的平均轴向深度选择主轴转速。当测试结果不稳定(颤振)时,选择后者。由于稳定性模型的输入参数也是根据测试结果划分的,因此使用有限的测试次数就能减少其不确定性,并提高铣削稳定性模型的精度。我们提供了一个案例研究来评估该算法。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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