Modification of the Properties of CdSe Nanowires by Argon Ion Implantation

IF 2.5 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-05-21 DOI:10.1007/s11664-024-11143-4
Chetna Narula, R. P. Chauhan, Ajay Garg, Pallavi Rana, Suresh Panchal, Renu Gupta
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Abstract

Cadmium selenide (CdSe) represents a direct-bandgap semiconductor belonging to the II–VI group, operating within the visible range of the electromagnetic spectrum. Nanowires composed of CdSe hold significant potential for various optoelectronic applications. Employing ion implantation is an immensely appealing technique, which allows for a controlled introduction of dopants into any lattice, and it is based on well-established principles. In this context, the current investigation focuses on the impact of argon ion implantation on cadmium selenide nanowires with a diameter of 80 nm. The nanowires were synthesized via a template-assisted electrodeposition method using polycarbonate membranes with 80 nm pores and 10 µm thickness. A three-electrode setup facilitated their fabrication. Subsequently, argon ions with a 4+ charge state and an energy of 1 MeV were implanted into the synthesized nanowires at varying fluence levels, ranging from 1011 to 1013 ions/cm2. The ion implantation process was conducted in the radiation chamber of the Inter-University Accelerator Centre’s low-energy ion implantation facility in New Delhi, India. Stopping and Range of Ions in Matter (SRIM) code simulations were employed to determine the optimal implantation parameters. Compositional analysis confirmed the successful incorporation of argon ions into the CdSe lattice. Notably, scanning electron microscopy revealed no alterations in the nanowire morphology despite the implantation. X-ray diffraction analysis showed no shift in the 2θ position of diffraction peaks, but indicated variations in their intensities. Furthermore, the implanted nanowires exhibited an increased absorbance and improved conductivity with increasing ion fluence. These findings demonstrate the effectiveness of argon ion implantation in modifying the optical and electrical properties of 80 nm diameter CdSe nanowires.

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通过氩离子注入改变碲化镉纳米线的性质
硒化镉(CdSe)是一种直接带隙半导体,属于II-VI族,在电磁波谱的可见范围内工作。由CdSe组成的纳米线在各种光电应用中具有重要的潜力。采用离子注入是一种非常吸引人的技术,它允许在任何晶格中可控地引入掺杂剂,并且基于成熟的原理。在此背景下,目前的研究重点是氩离子注入对直径为80 nm的硒化镉纳米线的影响。采用模板辅助电沉积法制备了孔径为80 nm、厚度为10µm的聚碳酸酯薄膜。三电极装置促进了它们的制造。随后,将带4+电荷态、能量为1 MeV的氩离子以1011 ~ 1013个离子/cm2的不同浓度注入合成的纳米线中。离子注入过程是在印度新德里大学间加速器中心的低能离子注入设施的辐射室中进行的。采用停止和物质中离子范围(SRIM)代码模拟来确定最佳注入参数。成分分析证实了氩离子成功地结合到CdSe晶格中。值得注意的是,扫描电子显微镜显示,尽管植入了纳米线,但纳米线的形态没有改变。x射线衍射分析表明,衍射峰的2θ位置没有变化,但其强度有所变化。此外,随着离子影响的增加,植入的纳米线的吸光度增加,电导率提高。这些发现证明了氩离子注入对80nm直径的CdSe纳米线的光学和电学性能的影响。
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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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